scholarly journals The Study of Reactive Ion Etching of Heavily Doped Polysilicon Based on HBr/O2/He Plasmas for Thermopile Devices

Materials ◽  
2020 ◽  
Vol 13 (19) ◽  
pp. 4278
Author(s):  
Na Zhou ◽  
Junjie Li ◽  
Haiyang Mao ◽  
Hao Liu ◽  
Jinbiao Liu ◽  
...  

Heavily doped polysilicon layers have been widely used in the fabrication of microelectromechanical systems (MEMS). However, the investigation of high selectivity, anisotropy, and excellent uniformity of heavily doped polysilicon etching is limited. In this work, reactive ion etching of undoped and heavily doped polysilicon-based hydrogen bromide (HBr) plasmas have been compared. The mechanism of etching of heavily doped polysilicon is studied in detail. The final results demonstrate that the anisotropy profile of heavily doped polysilicon can be obtained based on a HBr plasma process. An excellent uniformity of resistance of the thermocouples reached ± 2.11%. This technology provides an effective way for thermopile and other MEMS devices fabrication.

2004 ◽  
Vol 224 (1-4) ◽  
pp. 222-226 ◽  
Author(s):  
C.S. Wang ◽  
D.Y. Shu ◽  
W.Y. Hsieh ◽  
M.-J. Tsai

2001 ◽  
Vol 227-228 ◽  
pp. 801-804 ◽  
Author(s):  
Lin Guo ◽  
Kaicheng Li ◽  
Daoguang Liu ◽  
Yihong Ou ◽  
Jing Zhang ◽  
...  

1994 ◽  
Vol 141 (12) ◽  
pp. 3456-3462 ◽  
Author(s):  
Donna Cote ◽  
Son Nguyen ◽  
David Dobuzinsky ◽  
Cathy Basa ◽  
Bernhard Neureither

1998 ◽  
Vol 8 (4) ◽  
pp. 272-278 ◽  
Author(s):  
P-A Clerc ◽  
L Dellmann ◽  
F Grétillat ◽  
M-A Grétillat ◽  
P-F Indermühle ◽  
...  

Author(s):  
Shawn X. D. Zhang ◽  
Ronald Hon ◽  
S. W. Ricky Lee

Deep reactive ion etching (DRIE) is a major microfabrication process for micro-electro-mechanical system (MEMS) devices. In recent years DRIE is also applied to make through-silicon-vias (TSVs) for 3D packaging. Typical DRIE-formed TSVs are in the range of a few microns to tens of microns. In the present study, silicon vias with diameters in the sub-micron range (0.5 μm and 0.8 μm) are attempted. For comparison purposes, larger silicon vias (1 μm and 3 μm) are fabricated as well. In this paper, the microfabrication processes are described. The experimental results and comparisons in terms of via uniformity, aspect ratio dependent etching, undercutting, and effects of various mask materials are discussed in detail.


2000 ◽  
Vol 640 ◽  
Author(s):  
Mehran Mehregany ◽  
Christian A. Zorman

ABSTRACTThis paper reviews the development of a multilayer, micromolding-based surface micromachining process for SiC microelectromechanical systems (MEMS). The micromolding process uses polysilicon and SiO2 thin films that are deposited onto polysilicon and SiO2 sacrificial layers, patterned into micromolds by reactive ion etching, filled with polycrystalline SiC (poly-SiC), planarized by mechanical polishing, and eventually dissolved and released in selective wet chemical etchants. In addition, a SiC lift-off technique that exploits the microstructural differences between SiC films deposited on Si, SiO2 and Si3N4 surfaces has been developed. The micromolding and lift-off techniques are being used as the basic patterning processes for a four-layer, poly-SiC surface micromachining process that we call the MUSiC (Multi-User SiC) process.


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