scholarly journals Applied Cryptography Using Chaos Function for Fast Digital Logic-Based Systems in Ubiquitous Computing

Entropy ◽  
2015 ◽  
Vol 17 (3) ◽  
pp. 1387-1410 ◽  
Author(s):  
Piyush Shukla ◽  
Ankur Khare ◽  
Murtaza Rizvi ◽  
Shalini Stalin ◽  
Sanjay Kumar
Keyword(s):  
Ubiquitous Computing ◽  
Digital Logic ◽  
Applied Cryptography

scholarly journals An Intelligent and Fast Chaotic Encryption Using Digital Logic Circuits for Ad-Hoc and Ubiquitous Computing

Entropy ◽  
2016 ◽  
Vol 18 (5) ◽  
pp. 201 ◽  
Author(s):  
Ankur Khare ◽  
Piyush Shukla ◽  
Murtaza Rizvi ◽  
Shalini Stalin
Keyword(s):  
Ubiquitous Computing ◽  
Ad Hoc ◽  
Logic Circuits ◽  
Digital Logic ◽  
Chaotic Encryption

Digital Logic Design

2009 ◽  
Author(s):  
Guy Even ◽  
Moti Medina
Keyword(s):  
Digital Logic ◽  
Logic Design

Non-Invasive Gait Monitoring in a Ubiquitous Computing House

2010 ◽  
Vol 130 (3) ◽  
pp. 383-387 ◽  
Author(s):  
Yuji Ohta ◽  
Nobuhisa Motooka ◽  
Itiro Siio ◽  
Koji Tsukada ◽  
Keisuke Kambara
Keyword(s):  
Ubiquitous Computing ◽  
Non Invasive ◽  
Gait Monitoring

Improvement of Single-Electron Digital Logic Gates by Utilizing Input Discretizers

2016 ◽  
Vol E99.C (2) ◽  
pp. 285-292 ◽  
Author(s):  
Tran THI THU HUONG ◽  
Hiroshi SHIMADA ◽  
Yoshinao MIZUGAKI
Keyword(s):  
Logic Gates ◽  
Single Electron ◽  
Digital Logic

DIGITALIZATION OF LABOR MIGRATION PROCESSES IN UZBEKISTAN. WORLD EXPERIENCE

2020 ◽  
Vol 4 (3) ◽  
pp. 29-39
Author(s):  
Sulkhiya Gazieva ◽  
Keyword(s):  
Labor Market ◽  
Technological Change ◽  
Labor Migration ◽  
Smart Phone ◽  
Logic Circuits ◽  
Digital Logic ◽  
The Internet ◽  
The Future

The future of labor market depends upon several factors, long-term innovation and the demographic developments. However, one of the main drivers of technological change in the future is digitalization and central to this development is the production and use of digital logic circuits and its derived technologies, including the computer,the smart phone and the Internet. Especially, smart automation will perhaps not cause e.g.regarding industries, occupations, skills, tasks and duties

Combine Micro-Probing and OBIRCH to Catch Non-Recognizable Fault in RF and Mixed-Mode Integrated Circuits

2007 ◽  
Author(s):  
Cha-Ming Shen ◽  
Yen-Long Chang ◽  
Lian-Fon Wen ◽  
Tan-Chen Chuang ◽  
Shi-Chen Lin ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Radio Frequency ◽  
Failure Analysis ◽  
Case Studies ◽  
Mixed Mode ◽  
Failure Mechanisms ◽  
Deep Submicron ◽  
Digital Logic ◽  
Successful Approach ◽  
Cmos Processes

Abstract Highly-integrated radio frequency and mixed-mode devices that are manufactured in deep-submicron or more advanced CMOS processes are becoming more complex to analyze. The increased complexity presents us with many eccentric failure mechanisms that are uniquely different from traditional failure mechanisms found during failure analysis on digital logic applications. This paper presents a novel methodology to overcome the difficulties and discusses two case studies which demonstrate the application of the methodology. Through the case studies, the methodology was proven to be a successful approach. It is also proved how this methodology would work for such non-recognizable failures.

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