scholarly journals Evaluation of Thin Copper Wire and Lead-Free Solder Joint Strength by Pullout Tests and Wire Surface Observation

Crystals ◽  
2017 ◽  
Vol 7 (8) ◽  
pp. 255 ◽  
Author(s):  
Naoya Tada ◽  
Takuhiro Tanaka ◽  
Takeshi Uemori ◽  
Toshiya Nakata
Keyword(s):  
Solder Joint ◽  
Joint Strength ◽  
Copper Wire ◽  
Lead Free ◽  
Lead Free Solder ◽  
Wire Surface ◽  
Surface Observation ◽  
Pullout Tests ◽  
Free Solder

Effect of Added Elements on Microstructures and Joint Strength of Lead-Free Sn-Based Solder Joint Dispersed IMC Pillar

2016 ◽  
Vol 879 ◽  
pp. 2216-2221 ◽  
Author(s):  
Yawara Hayashi ◽  
Ikuo Shohji ◽  
Yusuke Nakata ◽  
Tomihito Hashimoto
Keyword(s):  
Solder Joint ◽  
Shear Force ◽  
Joint Strength ◽  
High Reliability ◽  
Bonding Time ◽  
Lead Free ◽  
Joint Interface ◽  
Lead Free Solder ◽  
Uniform Dispersion ◽  
Free Solder

To create a high reliability solder joint using IMCs dispersed in the joint, the joints with four types of lead-free solder were investigated. The joint with Sn-3.0Ag-0.7Cu-5.0In (mass%) has high die shear force compared to other joints investigated, and the joint with the Ni-electroplated Cu bonded at 300 oC for 30 min showed the maximum die shear force due to formation of a large number of fine IMCs. In the joint with Sn-0.7Cu-0.05Ni (mass%), uniform dispersion of a large number of IMCs was achieved, although the die shear force of the joint is lower than that of the joint with Sn-3.0Ag-0.7Cu-5.0In. In the joint with Sn-5.0Sb (mass%), a solder area was remained in the center of the joint although a large number of columnar IMCs form at the joint interface. The die shear force of the joint with Sn-5.0Sb increased with increasing the bonding time due to formation and growth of IMCs. In the joint with Sn-3.0Ag-0.5Cu (mass%), IMCs formed at the joint interface and did not disperse in the entire joint.

Impact reliability estimation of lead free solder joint with IMC layer

2009 ◽  
Vol 517 (14) ◽  
pp. 4255-4259 ◽  
Author(s):  
Jong-Min Kim ◽  
Seung-Wan Woo ◽  
Yoon-Suk Chang ◽  
Young-Jin Kim ◽  
Jae-Boong Choi ◽  
...  
Keyword(s):  
Solder Joint ◽  
Reliability Estimation ◽  
Lead Free ◽  
Lead Free Solder ◽  
Free Solder ◽  
Impact Reliability

Root Cause Investigation of Lead-Free Solder Joint Interfacial Failures After Multiple Reflows

2016 ◽  
Vol 46 (3) ◽  
pp. 1674-1682 ◽  
Author(s):  
Yan Li ◽  
Olen Hatch ◽  
Pilin Liu ◽  
Deepak Goyal
Keyword(s):  
Solder Joint ◽  
Lead Free ◽  
Lead Free Solder ◽  
Root Cause ◽  
Free Solder

Study on High Reliability of Lead-Free Solder Joint on Metal Substrate

2011 ◽  
Author(s):  
Kanji Takagi ◽  
Masaki Wakabayashi ◽  
Junichi Inoue ◽  
Qiang Yu ◽  
Takahiro Akutsu
Keyword(s):  
Thermal Conductivity ◽  
Solder Joint ◽  
Rupture Life ◽  
Metal Substrate ◽  
Lead Free ◽  
Lead Free Solder ◽  
Insulating Layer ◽  
Heating Device ◽  
Propagation Analysis ◽  
Free Solder

This paper proposes the high reliable design method for lead-free solder joint on metal substrate on chip component. First, the crack propagation analysis method for estimating rupture life of solder joint was constructed. And then, the effect of material properties of insulating layer on metal substrate and solder joint shape for rupture life of solder joint was evaluated using crack propagation analysis. As the result, the relation between young’s modulus of insulating layer and rupture life was indicated quantitatively. Also, the relation of filet length for rupture life of solder joint was evaluated. Secondary, evaluation method of heat dissipation for metal substrate was proposed. Because thermal conductivity of insulating layer affects temperature rise of heating device. And, the relation between thermal conductivity of insulating layer and temperature rise of heating device was indicated.

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