A Flat High-Frequency Scanning Micromirror

High frequency scanning acoustic microscopy: a novel non-destructive surface analytical tool for assessment of coating-specific elastic moduli and tomographic study of subsurface defects

Thin Solid Films ◽

10.1016/s0040-6090(99)00542-8 ◽

1999 ◽

Vol 355-356 ◽

pp. 347-352 ◽

Cited By ~ 13

Author(s):

D. Rats ◽

J. von Stebut ◽

F. Augereau

Keyword(s):

High Frequency ◽

Elastic Moduli ◽

Analytical Tool ◽

Acoustic Microscopy ◽

Scanning Acoustic Microscopy ◽

Frequency Scanning ◽

Non Destructive ◽

Subsurface Defects

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High frequency scanning acoustic microscopy applied to 3D integrated process: Void detection in Through Silicon Vias

2013 IEEE 63rd Electronic Components and Technology Conference ◽

10.1109/ectc.2013.6575576 ◽

2013 ◽

Cited By ~ 12

Author(s):

Alain Phommahaxay ◽

Ingrid De Wolf ◽

Peter Hoffrogge ◽

Sebastian Brand ◽

Peter Czurratis ◽

...

Keyword(s):

High Frequency ◽

Acoustic Microscopy ◽

Scanning Acoustic Microscopy ◽

Integrated Process ◽

Through Silicon Vias ◽

Void Detection ◽

Frequency Scanning ◽

Silicon Vias

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Simulations for investigating contrast mechanism of biological cells with high‐frequency scanning acoustic microscopy.

The Journal of the Acoustical Society of America ◽

10.1121/1.3383455 ◽

2010 ◽

Vol 127 (3) ◽

pp. 1732-1732

Author(s):

Yada Juntarapaso ◽

Richard L. Tutwiler

Keyword(s):

High Frequency ◽

Acoustic Microscopy ◽

Scanning Acoustic Microscopy ◽

Biological Cells ◽

Frequency Scanning ◽

Contrast Mechanism

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In vitro measurements of acoustic properties using a high‐frequency scanning acoustic microscope (SAM)

The Journal of the Acoustical Society of America ◽

10.1121/1.4780129 ◽

2004 ◽

Vol 115 (5) ◽

pp. 2377-2377

Author(s):

Caleb H. Farny ◽

T. L. Szabo ◽

Ronald A. Roy ◽

Robin O. Cleveland

Keyword(s):

High Frequency ◽

Acoustic Properties ◽

Acoustic Microscope ◽

Frequency Scanning ◽

In Vitro Measurements ◽

Scanning Acoustic Microscope

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High Frequency Scanning Gate Microscopy and Local Memory Effect of Carbon Nanotube Transistors

Nano Letters ◽

10.1021/nl050316a ◽

2005 ◽

Vol 5 (5) ◽

pp. 893-896 ◽

Cited By ~ 9

Author(s):

Cristian Staii ◽

Alan T. Johnson ◽

Rui Shao ◽

Dawn A. Bonnell

Keyword(s):

Carbon Nanotube ◽

Memory Effect ◽

High Frequency ◽

Local Memory ◽

Carbon Nanotube Transistors ◽

Scanning Gate Microscopy ◽

Frequency Scanning ◽

Scanning Gate ◽

Nanotube Transistors

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A technique for high-frequency scanning of high power laser light for laser-wire scanners at electron accelerators

2007 IEEE Particle Accelerator Conference (PAC) ◽

10.1109/pac.2007.4440232 ◽

2007 ◽

Author(s):

A. Bosco ◽

G.A. Blair ◽

S. T. Boogert ◽

G. Boorman

Keyword(s):

High Power ◽

High Frequency ◽

Laser Light ◽

High Power Laser ◽

Power Laser ◽

Electron Accelerators ◽

Frequency Scanning

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High-power acoustic insult to living cultured cells as studied by high-frequency scanning acoustic microscopy

10.1117/12.469895 ◽

2002 ◽

Author(s):

Chiaki Miyasaka ◽

Bernhard R. Tittmann

Keyword(s):

High Power ◽

High Frequency ◽

Cultured Cells ◽

Acoustic Microscopy ◽

Scanning Acoustic Microscopy ◽

Frequency Scanning

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Transducer designs and simulations for high frequency scanning acoustic microscopy for applications in exploring contrast mechanism and the mechanical properties of biological cells

The Journal of the Acoustical Society of America ◽

10.1121/1.3654888 ◽

2011 ◽

Vol 130 (4) ◽

pp. 2462-2462

Author(s):

Yada Juntarapaso ◽

Richard L. Tutwiler ◽

Pavlos Anastasiadis

Keyword(s):

Mechanical Properties ◽

High Frequency ◽

Acoustic Microscopy ◽

Scanning Acoustic Microscopy ◽

Biological Cells ◽

Frequency Scanning ◽

Contrast Mechanism

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Inverted high frequency Scanning Acoustic Microscopy inspection of power semiconductor devices

Microelectronics Reliability ◽

10.1016/j.microrel.2012.06.064 ◽

2012 ◽

Vol 52 (9-10) ◽

pp. 2115-2119 ◽

Cited By ~ 7

Author(s):

Poschgan Mario ◽

Maynollo Josef ◽

Inselsbacher Michael

Keyword(s):

High Frequency ◽

Semiconductor Devices ◽

Acoustic Microscopy ◽

Scanning Acoustic Microscopy ◽

Power Semiconductor ◽

Power Semiconductor Devices ◽

Frequency Scanning

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Two-dimensional measurements of microwave voltage- amplitude and phase distributions within a monolithic integrated interdigital capacitor with a high frequency scanning force microscope test system

Microelectronic Engineering ◽

10.1016/0167-9317(95)00342-8 ◽

1996 ◽

Vol 31 (1-4) ◽

pp. 187-194 ◽

Cited By ~ 4

Author(s):

A. Leyk ◽

E. Kubalek

Keyword(s):

High Frequency ◽

Test System ◽

Two Dimensional ◽

Voltage Amplitude ◽

Scanning Force Microscope ◽

Interdigital Capacitor ◽

Frequency Scanning ◽

Dimensional Measurements ◽

Scanning Force

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