scholarly journals A test protocol to screen capacitors for radiation-induced charge loss.

2008 ◽  
Author(s):  
Thomas Andrew Zarick ◽  
E. Frederick Hartman
Keyword(s):  
Test Protocol ◽  
Charge Loss ◽  
Radiation Induced ◽  
Induced Charge

Radiation Induced Charge Loss Mechanisms Across the Dielectrics of Floating Gate Flash Memories

2019 ◽  
Vol 6 (3) ◽  
pp. 807-843
Author(s):  
Giorgio Cellere ◽  
Andrea Cester ◽  
Alessandro Paccagnella
Keyword(s):  
Floating Gate ◽  
Flash Memories ◽  
Charge Loss ◽  
Radiation Induced ◽  
Induced Charge ◽  
Loss Mechanisms

scholarly journals Numerical modeling of radiation-induced charge loss in CMOS floating gate cells

Elektron ◽  
2021 ◽  
Vol 5 (2) ◽  
pp. 100-104
Author(s):  
Lucas Sambuco Salomone ◽  
Mariano Garcia-Inza ◽  
Sebastián Carbonetto ◽  
Adrián Faigón
Keyword(s):  
Numerical Modeling ◽  
Floating Gate ◽  
Charge Loss ◽  
Radiation Induced ◽  
Induced Charge

Mediante un modelo numérico desarrollado recientemente y basado en principios físicos, se estudia la respuesta a la radiación de celdas de compuerta flotante programadas/borradas. El rol que juega la captura de carga en los óxidos en el desplazamiento total de la tensión umbral con la dosis es debidamente evaluado a través de la variación de la tasa de captura de los huecos generados por radiación. Se considera un modelo analítico simplificado y se discuten sus limitaciones.

Radiation-induced charge transfer inefficiency in charge-coupled devices: Sentinel-4 CCD pre-development as a case study

2014 ◽  
Author(s):  
T. Prod'homme ◽  
J.-M. Belloir ◽  
H. Weber ◽  
G. Bazalgette Courrèges-Lacoste ◽  
R. Meynart ◽  
...  
Keyword(s):  
Charge Transfer ◽  
Charge Coupled Devices ◽  
Radiation Induced ◽  
Induced Charge

Effect of radiation-induced charge on 1/f noise in MOS devices

1990 ◽  
Vol 37 (6) ◽  
pp. 1696-1702 ◽  
Author(s):  
T.L. Meisenheimer ◽  
D.M. Fleetwood
Keyword(s):  
Mos Devices ◽  
Radiation Induced ◽  
Induced Charge
Sign in / Sign up

Export Citation Format

Share Document