Structure And Mechanical Properties Of Reactive Sputter Deposited Tin/Tan Multilayered Films

1997 ◽  
Vol 505 ◽  
Author(s):  
W.-H. Soe ◽  
T. Kitagaki ◽  
H. Ueda ◽  
N. Shima ◽  
M. Otsuka ◽  
...  
Keyword(s):  
Diffraction Method ◽  
Dislocation Motion ◽  
X Ray Diffraction ◽  
Multilayered Films ◽  
X Ray ◽  
Composition Modulation ◽  
Hardness Change ◽  
Sputter Deposited ◽  
Coherency Strains ◽  
Hardness Values

ABSTRACTTiN/TaN multilayers were grown by reactive magnetron sputtering on WC-Co sintered hard alloy and MgO(100) single crystal substrates. Multilayer structure and composition modulation amplitudes were studied using x-ray diffraction method. Hardness and elastic modulus were mea- sured by nanoindentation tester. For bilayer thickness (Λ) larger than 80 A˚, hardness are lower than rule-of-mixtures value of individual single layers, and increased rapidly with decreasing Λ, peaking at hardness values ≈33% higher than that at A=43 Å. As a result of analysis the inclination of applied load for indenter displacement on P-h curve (ΔP/Δh), this paper exhibits that the en- hancement of the resistance to dislocation motion and elastic anomaly due to coherency strains are responsible for the hardness change.

Reactive-Sputter Deposition of TiN/ZrN and TiN/CrN Multilayers: Structural and Mechanical Properties

1996 ◽  
Vol 458 ◽  
Author(s):  
W.-H. Soe ◽  
T. Kitagaki ◽  
H. Ueda ◽  
N. Shima ◽  
M. Otsuka ◽  
...  
Keyword(s):  
Elastic Modulus ◽  
Lattice Mismatch ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
Individual Values ◽  
Reactive Sputter Deposition ◽  
Hardness Change ◽  
The Difference ◽  
Elastic Anomalies ◽  
Coherency Strains

ABSTRACTPolycrystalline TiN/ZrN multilayers with a 7.5% lattice mismatch between the layers and TiN/CrN multilayers with a 2.3% mismatch were grown by reactive magnetron sputtering on WC/Co sintered hard alloy substrates. Multilayer structure and composition modulation amplitudes were studied using x-ray diffraction method. Hardness and elastic modulus were measured by nanoindentation testing. Hardness of TiN/ZrN multilayers decreased rapidly with increasing bilayer thickness (Λ), peaking at hardness values ≈30% lower than rul e-of-mixtures values at Λ=30 Å, before increasing slightly with further increases in Λ. A comparison with other lattice mismatched systems, TiN/VN and TiN/NbN, showed a similar hardness variation, but a sign was negative. The results suggest that coherency strains were responsible for the larger hardness change. Nanoindenter elastic modulus results showed the same behavior with hardness dependence, i.e., elastic softening at Λ=30 Å. The results of TiN/CrN systems showed no hardness and elastic anomalies within boundaries corresponding to individual values. It was thought too large the difference between hardness (or modulus) of TiN and CrN.

An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

2006 ◽  
Vol 524-525 ◽  
pp. 13-18 ◽  
Author(s):  
A. Kumar ◽  
U. Welzel ◽  
M. Wohlschlögel ◽  
W. Baumann ◽  
Eric J. Mittemeijer
Keyword(s):  
Penetration Depth ◽  
Stress Gradient ◽  
Diffraction Method ◽  
Nickel Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Stress Measurements ◽  
Information Depth ◽  
Depth Control ◽  
Sputter Deposited

A rigorous strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths is described. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges of accessible penetration/information depths and experimental aspects are briefly discussed. The power of the method is illustrated by the analysis of an only small stress gradient in a sputter-deposited nickel layer.

Enhanced Mechanical Hardness in Compositionally Modulated Fe/Pt and Fe/Cr Epitaxial Thin Films

1994 ◽  
Vol 343 ◽  
Author(s):  
B. J. Daniels ◽  
W. D. Nix ◽  
B. M. Clemens
Keyword(s):  
Mechanical Behavior ◽  
Dislocation Motion ◽  
Epitaxial Thin Films ◽  
X Ray Diffraction ◽  
Maximum Enhancement ◽  
Multilayer Systems ◽  
X Ray ◽  
Rule Of Mixtures ◽  
Wide Range ◽  
Sputter Deposited

ABSTRACTThe hardnesses and elastic moduli of sputter-deposited Fe/Pt and Fe/Cr multilayers grown on MgO(001) are evaluated as a function of composition wavelength, Λ. Structural determination by x-ray diffraction showed these films to be oriented in the plane as well as out of the plane. The mechanical behavior of these films was evaluated by nanoindentation. The combination of nanoindentation and x-ray diffraction is an attempt to determine the structural underpinnings of the mechanical behavior of these metal multilayer systems. For both systems there is no observed enhancement in the elastic modulus (the so-called supermodulus effect) across a wide range of bilayer spacings. Nanoindentation results show that for Fe/Pt multilayers, the hardness is enhanced over that expected from a simple rule of mixtures by a factor of approximately 2.5, with a maximum enhancement of 2.8 times this value at a wavelength of 25 Å. This enhancement in hardness occurs for bilayer spacings from 20 Å to 100 Å and is not a strong function of Λ over this range. Results for Fe/Cr multilayers show a hardness enhancement over a similar wavelength range of approximately two times the rule of mixtures value, with a maximum enhancement of 2.2 times this value at a wavelength of 40 Å. The larger hardness enhancement in the Fe/Pt system may be due to the structural barrier (FCC/BCC) to dislocation motion between the two materials. The dominant mechanism responsible for the hardness enhancement in Fe/Pt and Fe/Cr multilayers is not yet known, however three models for dislocation interactions which could account for the hardness enhancement in these multilayers are discussed.

Lack of hardening effect in TiN/NbN multilayers

2001 ◽  
Vol 673 ◽  
Author(s):  
Jon M. Molina-Aldareguia ◽  
Stephen J. Lloyd ◽  
Zoe H. Barber ◽  
William J. Clegg
Keyword(s):  
Multilayer Films ◽  
Dislocation Motion ◽  
Deformation Mechanisms ◽  
Modulation Amplitude ◽  
Reactive Magnetron ◽  
Interface Thickness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Composition Modulation ◽  
Nanoindentation Hardness

ABSTRACTThere is evidence indicating that multilayer films can be harder than monolithic ones. To investigate this, TiN/NbN multilayers with bilayer thicknesses ranging from 4 nm to 30 nm have been grown on MgO (001) single crystals using reactive magnetron sputtering. The sharpness of the interface and the composition modulation, which would be expected to strongly influence dislocation motion, have been studied by X-ray diffraction (XRD). These experiments show that the interfaces remain reasonably sharp (interface thickness ∼1 nm) and the composition modulation amplitude is maximum for multilayers with bilayer thicknesses greater than ∼10 nm. With thinner bilayers, the composition modulation decreases but the layered structure remains. Despite this, the nanoindentation hardness of the multilayers is between 20 and 25 GPa, which is similar to that of TiN and NbN alone, and therefore, no hardening due to the layering is observed. The deformation mechanisms observed under the indent in the TEM are consistent with these results.

Structure of Copper-Hafnium Multilayers

1986 ◽  
Vol 77 ◽  
Author(s):  
B. M. Clemens ◽  
J. P. Stec ◽  
S. M. Heald ◽  
J. M. Tranquada
Keyword(s):  
Interfacial Layer ◽  
Growth Direction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Composition Modulation ◽  
Layer Sample ◽  
Structural Coherence ◽  
Sputter Deposited ◽  
Elemental Layer ◽  
Modulation Wavelength

ABSTRACTThe structure of copper-hafnium multilayers has been studied as a function of composition modulation wavelength by x-ray diffraction and EXAFS. Sputter deposited samples were produced with composition modulation wavelengths of 1/2, 5, 7, 10, 14, and 20 close packed planes of each constituent per layer. The structure evolved anisotropically from amorphous to crystalline with increasing composition modulation wavelength, with crystalline order first appearing in the growth direction in the 7 mono-layer sample. Structural coherence in the growth direction was not observed to extend beyond one elemental layer in any sample, and evidence for a disordered interfacial layer was observed by EXAFS for all samples. Small angle x-ray diffraction showed strong composition modulation for all but the 1/2 monolayer sample. The amorphous interface is the result of reaction during deposition similar to the solid state reaction observed in other systems such as nickel-zirconium.

Microstructure and Mechanical Characteristics of the CrN/Si3N4 Multilayered Films Prepared by Sputtering

2012 ◽  
Vol 476-478 ◽  
pp. 2571-2574
Author(s):  
Chien Cheng Liu ◽  
Kuang I Liu ◽  
Hao Tung Lin ◽  
Yung Mao Cheng
Keyword(s):  
Mechanical Characteristics ◽  
Diffraction Field ◽  
X Ray Diffraction ◽  
Multilayered Films ◽  
X Ray ◽  
Number Of Layers ◽  
Microstructure Morphology ◽  
Pin On Disk ◽  
Steel Substrates ◽  
Hardness Values

Multilayers of CrN/Si3N4 coatings were prepared by magnetron sputtering on die steel substrates. The layers of CrN/Si3N4 films were varied to investigate their effects on microstructure, morphology, nano-hardness properties determined by X-ray diffraction, field-emission scanning electron microscope (FE-SEM), nanoindentation, and pin-on-disk, respectively. The result shows that CrN has highly (111) preferred orientation and Si3N4 exhibits amorphous phase at working temperature of 200 oC. The surface of coatings revealed smaller grains and uniform dense with higher layers. The number of layers increased with enhancing of the mechanical properties, and hardness values. At 64 layers films had the largest nano-hardness. Besides, the highest layers of CrN/Si3N4 multilayers have been achieved the lowest friction coefficient for against steel ball.

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

scholarly journals Preparation of high-entropy carbides by different sintering techniques

2021 ◽  
Vol 56 (19) ◽  
pp. 11237-11247 ◽  
Author(s):  
Johannes Pötschke ◽  
Manisha Dahal ◽  
Mathias Herrmann ◽  
Anne Vornberger ◽  
Björn Matthey ◽  
...  
Keyword(s):  
Grain Size ◽  
Single Phase ◽  
X Ray Diffraction ◽  
Vacuum Sintering ◽  
X Ray ◽  
High Entropy ◽  
Mean Grain Size ◽  
The Mean ◽  
Gas Pressure Sintering ◽  
Hardness Values

AbstractDense (Hf, Ta, Nb, Ti, V)C- and (Ta, Nb, Ti, V, W)C-based high-entropy carbides (HEC) were produced by three different sintering techniques: gas pressure sintering/sinter–HIP at 1900 °C and 100 bar Ar, vacuum sintering at 2250 °C and 0.001 bar as well as SPS/FAST at 2000 °C and 60 MPa pressure. The relative density varied from 97.9 to 100%, with SPS producing 100% dense samples with both compositions. Grain size measurements showed that the substitution of Hf with W leads to an increase in the mean grain size of 5–10 times the size of the (Hf, Ta, Nb, Ti, V,)C samples. Vacuum-sintered samples showed uniform grain size distribution regardless of composition. EDS mapping revealed the formation of a solid solution with no intermetallic phases or element clustering. X-ray diffraction analysis showed the structure of mostly single-phase cubic high-entropy carbides. Hardness measurements revealed that (Hf, Ta, Nb, Ti, V)C samples possess higher hardness values than (Ta, Nb, Ti, V, W)C samples.

scholarly journals Growth of sillenite Bi12FeO20 single crystals: structural, thermal, optical, photocatalytic features and first principle calculations

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Durga Sankar Vavilapalli ◽  
Ambrose A. Melvin ◽  
F. Bellarmine ◽  
Ramanjaneyulu Mannam ◽  
Srihari Velaga ◽  
...  
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Diffraction Method ◽  
Lattice Parameter ◽  
First Principle ◽  
X Ray Diffraction ◽  
X Ray ◽  
First Principle Calculations ◽  
Photodegradation Efficiency

AbstractIdeal sillenite type Bi12FeO20 (BFO) micron sized single crystals have been successfully grown via inexpensive hydrothermal method. The refined single crystal X-ray diffraction data reveals cubic Bi12FeO20 structure with single crystal parameters. Occurrence of rare Fe4+ state is identified via X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS). The lattice parameter (a) and corresponding molar volume (Vm) of Bi12FeO20 have been measured in the temperature range of 30–700 °C by the X-ray diffraction method. The thermal expansion coefficient (α) 3.93 × 10–5 K−1 was calculated from the measured values of the parameters. Electronic structure and density of states are investigated by first principle calculations. Photoelectrochemical measurements on single crystals with bandgap of 2 eV reveal significant photo response. The photoactivity of as grown crystals were further investigated by degrading organic effluents such as Methylene blue (MB) and Congo red (CR) under natural sunlight. BFO showed photodegradation efficiency about 74.23% and 32.10% for degrading MB and CR respectively. Interesting morphology and microstructure of pointed spearhead like BFO crystals provide a new insight in designing and synthesizing multifunctional single crystals.

Sign in / Sign up

Export Citation Format

Share Document