Structure of Copper-Hafnium Multilayers

1986 ◽  
Vol 77 ◽  
Author(s):  
B. M. Clemens ◽  
J. P. Stec ◽  
S. M. Heald ◽  
J. M. Tranquada
Keyword(s):  
Interfacial Layer ◽  
Growth Direction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Composition Modulation ◽  
Layer Sample ◽  
Structural Coherence ◽  
Sputter Deposited ◽  
Elemental Layer ◽  
Modulation Wavelength

ABSTRACTThe structure of copper-hafnium multilayers has been studied as a function of composition modulation wavelength by x-ray diffraction and EXAFS. Sputter deposited samples were produced with composition modulation wavelengths of 1/2, 5, 7, 10, 14, and 20 close packed planes of each constituent per layer. The structure evolved anisotropically from amorphous to crystalline with increasing composition modulation wavelength, with crystalline order first appearing in the growth direction in the 7 mono-layer sample. Structural coherence in the growth direction was not observed to extend beyond one elemental layer in any sample, and evidence for a disordered interfacial layer was observed by EXAFS for all samples. Small angle x-ray diffraction showed strong composition modulation for all but the 1/2 monolayer sample. The amorphous interface is the result of reaction during deposition similar to the solid state reaction observed in other systems such as nickel-zirconium.

Structure And Mechanical Properties Of Reactive Sputter Deposited Tin/Tan Multilayered Films

1997 ◽  
Vol 505 ◽  
Author(s):  
W.-H. Soe ◽  
T. Kitagaki ◽  
H. Ueda ◽  
N. Shima ◽  
M. Otsuka ◽  
...  
Keyword(s):  
Diffraction Method ◽  
Dislocation Motion ◽  
X Ray Diffraction ◽  
Multilayered Films ◽  
X Ray ◽  
Composition Modulation ◽  
Hardness Change ◽  
Sputter Deposited ◽  
Coherency Strains ◽  
Hardness Values

ABSTRACTTiN/TaN multilayers were grown by reactive magnetron sputtering on WC-Co sintered hard alloy and MgO(100) single crystal substrates. Multilayer structure and composition modulation amplitudes were studied using x-ray diffraction method. Hardness and elastic modulus were mea- sured by nanoindentation tester. For bilayer thickness (Λ) larger than 80 A˚, hardness are lower than rule-of-mixtures value of individual single layers, and increased rapidly with decreasing Λ, peaking at hardness values ≈33% higher than that at A=43 Å. As a result of analysis the inclination of applied load for indenter displacement on P-h curve (ΔP/Δh), this paper exhibits that the en- hancement of the resistance to dislocation motion and elastic anomaly due to coherency strains are responsible for the hardness change.

Structure and Mechanical Properties of Fe/Zr Multilayers.

1991 ◽  
Vol 239 ◽  
Author(s):  
Joost J. Vlassak ◽  
Takenori Nakayama ◽  
Toyohiko J. Konno ◽  
William D. Nix
Keyword(s):  
Elastic Modulus ◽  
Multilayer Films ◽  
Sputter Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Composition Modulation ◽  
Average Value ◽  
Transmission Electron ◽  
Continuous Indentation ◽  
Modulation Wavelength

ABSTRACTIron zirconium multilayer films have been prepared by sputter deposition and studied using x-ray diffraction, high-resolution transmission electron microscopy and Nanoindenter techniques. The composition-modulation wavelength was varied between 0.8 and 92 nm. For modulation wavelengths greater than 4 nm the multilayers are crystalline with amorphous interfaces; for smaller wavelengths the samples are entirely amorphous. It was not possible to obtain layered structures with wavelengths smaller than 0.8 nm.Both the hardness and the elastic modulus were measured as a function of composition-modulation wavelength by means of continuous indentation testing. The elastic modulus shows some variation with wavelength; the average value being 131 GPa. The hardness increases sharply when the modulation wavelength decreases below 4 nm. We attribute this increase to die crystalline to amorphous transition that occurs in these films at this wavelength.

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

Properties of Sputter Deposited ZnO Films Co-doped with Lithium and Phosphorus

2013 ◽  
Vol 1494 ◽  
pp. 77-82
Author(s):  
T. N. Oder ◽  
A. Smith ◽  
M. Freeman ◽  
M. McMaster ◽  
B. Cai ◽  
...  
Keyword(s):  
Rf Magnetron Sputtering ◽  
Zno Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sapphire Substrates ◽  
Hall Effect Measurements ◽  
Sputter Deposited ◽  
P Type ◽  
Post Deposition ◽  
Co Doped

ABSTRACTThin films of ZnO co-doped with lithium and phosphorus were deposited on sapphire substrates by RF magnetron sputtering. The films were sequentially deposited from ultra pure ZnO and Li3PO4 solid targets. Post deposition annealing was carried using a rapid thermal processor in O2 and N2 at temperatures ranging from 500 °C to 1000 °C for 3 min. Analyses performed using low temperature photoluminescence spectroscopy measurements reveal luminescence peaks at 3.359, 3.306, 3.245 eV for the co-doped samples. The x-ray diffraction 2θ-scans for all the films showed a single peak at about 34.4° with full width at half maximum of about 0.17°. Hall Effect measurements revealed conductivities that change from p-type to n-type over time.

Investigation of Magnetic Order in Iron Oxide-Nickel Oxide Superlattices with Modulation Wavelength Less Than 80 Å

1991 ◽  
Vol 231 ◽  
Author(s):  
S. D. Berry ◽  
D. M. Lind ◽  
G. Chern ◽  
H. Mathias ◽  
L. R. Testardi
Keyword(s):  
Magnetic Order ◽  
Spontaneous Magnetization ◽  
X Ray Diffraction ◽  
High Crystalline Quality ◽  
X Ray ◽  
Long Wavelength ◽  
Saturation Moment ◽  
Very High ◽  
Modulation Wavelength

AbstractWe have investigated the magnetic order, using SQUID magnetometry, for short modulation wavelength Fe3O4/NiO superlattices, grown on single crystal MgO. Ferrimagnetic Fe3O4 has a saturation moment of ~500 emu/cm3 at 0 K and a Curie temperature of 858 K, while bulk NiO is antiferromagnetic with a NMel temperature of 525 K. Very high crystalline quality with little interdiffusion is indicated by X-ray diffraction, SEM, optical microscopy, and in-situ RHEED, and the samples show highly anisotropic electrical conductivity which also indicates the strong modulation present. Long wavelength samples (Amod > 200 Å) have a behavior only slightly different from that expected from bulk Fe3O4, but for Amod<80 Å, spontaneous magnetization is replaced by paramagnetism, with weak temperature dependence (not I/T) from 5 K to 400 K.

scholarly journals Влияние толщины пленки Pt на изменение текстуры и доли кристаллической фазы при ее отжиге

2020 ◽  
Vol 90 (5) ◽  
pp. 795
Author(s):  
Р.В. Селюков ◽  
В.В. Наумов
Keyword(s):  
Volume Fraction ◽  
Curve Analysis ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Texture Parameters ◽  
Sputter Deposited ◽  
Pt Films ◽  
H 20

Textured Pt films with thickness h=20-80 nm were sputter deposited on oxidized c-Si (100) wafers and annealed in vacuum at 500°C/60 min. The thickness dependencies of the crystalline texture parameters and of the fraction of crystalline phase δ are obtained for as-deposited and annealed films using X-ray diffraction. The determination of δ in textured films is carried out by the new method based on rocking curve analysis. It is found that annealing leads to the texture improvement and to the increasing of δ for all h. The less h, the stronger effects of texture improvement and of δ increasing. These results are explained by the annealing-induced formation of large secondary grains whose volume fraction increases as h decreases. The inhomogeneity of the depth distributions of texture parameters and of δ are investigated for the as-deposited Pt films.

Synthesis and Properties of Sb Layered Te/Cd Stack Prepared by Elemental Stack Method

2012 ◽  
Vol 488-489 ◽  
pp. 76-81 ◽  
Author(s):  
Subramani Shanmugan ◽  
Mutharasu Devarajan ◽  
Kamarulazizi Ibrahim
Keyword(s):  
Thin Films ◽  
Chemical Composition ◽  
Surface Morphology ◽  
Shape Analysis ◽  
Structural Parameters ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electrical Studies ◽  
Sb Doping ◽  
Elemental Layer

Sb layered Te/Cd thin films have been prepared by using Stacked Elemental Layer (SEL) method. The presence of mixed phases (CdTe and Sb2Te3) in the films was confirmed by the x-ray diffraction technique. The calculated structural parameters demonstrated the feasibility of Sb doping via SEL method. The topographical and electrical studies of the synthesized thin films depicted the influence of Sb on both surface morphology and conductivity. The values of conductivity of the annealed films were in between 2 x 10-3 and 175 x 10-2 Scm-2. A desired chemical composition of films was confirmed from spectrum shape analysis using energy dispersive x-ray.

Crystallinity of YBa2Cu3O7−x single crystals grown by the pulling method

1996 ◽  
Vol 11 (4) ◽  
pp. 804-812 ◽  
Author(s):  
Y. Namikawa ◽  
M. Egami ◽  
S. Koyama ◽  
Y. Shiohara ◽  
H. Kutami
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Growth Direction ◽  
Annealed Sample ◽  
Seed Crystal ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Crystal Seed ◽  
Better Than

Large YBa2Cu3O7−x (Y123) single crystals (larger than 13 mm cubed) have been grown along the c-axis reproducibly by the modified pulling method. The crystallinity of Y123 single crystal was investigated by x-ray diffraction and x-ray topography. Crystals grown from an MgO single crystal seed had some low angle subgrain boundaries which tilted 0.1–0.8° from each other. These grain boundaries originated from the seed crystal, and the subgrains were extended along the growth direction from the seed crystal. Y123 single crystals with no marked subgrains in the whole area were obtained by using Y123 single subgrain crystal seeds. FWHM of the x-ray rocking curve for the crystal so produced was about 0.14°, which was much better than the spectrum consisting of several separated peaks obtained from the previous crystals. Tc onset of the annealed sample was about 93.6 K, and the transition width was about 0.9 K. The low angle subgrain boundaries did not seem to be effective pinning centers for the magnetic flux.

scholarly journals Interfacial Structure of Lattice Mismatched bcc(110)/bcc(110) Transition Metal Superlattices

1993 ◽  
Vol 307 ◽  
Author(s):  
Eric E. Fullerton ◽  
S. M. Mini ◽  
A. S. Bommannavar ◽  
C. H. Sowers ◽  
S. N. Ehrlich ◽  
...  
Keyword(s):  
Lattice Strain ◽  
Structural Model ◽  
Interfacial Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Strains ◽  
The Individual ◽  
Structural Characterizations ◽  
Modulation Wavelength ◽  
Coherent Interfaces

ABSTRACTWe present structural characterizations of a series of sputtered Fe/Nb and V/Nb superlattices by high-angle x-ray diffraction. Diffraction scans were performed with the scattering vector at various angles (χ) with respect to the layers. χ=0° diffraction spectra (normal to the layers) were fitted to a general structural model to determine the (110) lattice strains, interfacial disorder and interdiffusion. χ>0° spectra probe the lattice strain of the individual layers and the in-plane interfacial coherence. Both systems form incoherent interfaces above a critical modulation wavelength (ΛC). At ΛC, the Fe/Nb system undergoes a crystalline-to-amorphous transition while the V/Nb forms in-plane coherent interfaces.

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