Modeling and 2D Numerical Simulation of Transient Phenomena in Floating Body Soi Mosfets
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ABSTRACTThis paper presents a numerical-simulation-based investigation of drain current transients in floating body partially and fully depleted n-channel SOI MOSFETs. For both Zerbst-type and overshoot transients, analytical models are developed and validated. An original contribution concerns the detailed study of drain and source junction influences on the transient regime.
2005 ◽
Vol 49
(9)
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pp. 1536-1546
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2004 ◽
Vol 48
(7)
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pp. 1211-1221
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2012 ◽
Vol 271-272
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pp. 21-25
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2021 ◽
Vol 3
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pp. 100037
2021 ◽
Vol 144
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pp. 104816