Study of Thin Film Ferroelectric Superlattices

1996 ◽  
Vol 433 ◽  
Author(s):  
Y. Kim ◽  
A. Erbil ◽  
E.W. Thomas ◽  
A. Kushwaha ◽  
R. Gerhardt

AbstractThe study of ferroelectric thin films has evoked special interest owing to their numerous applications. In this study, epitaxial or highly oriented PbTiO3/PLT (Lead Titanate / La modified Lead Titanate) ferroelectric superlattice thin films were grown by the metalorganic chemical vapor deposition (MOCVD) technique. Compositional modulation by Secondary Ion Mass Spectroscopy (SIMS) established the nature of these films as desirable for high quality device applications. The thickness and the refractive index of each film was determined by using a prism coupler. The dielectric behavior of these films was studied as a function of frequency.

1994 ◽  
Vol 361 ◽  
Author(s):  
M. Vellaikal ◽  
A. Kingon

ABSTRACTLead titanate thin films were deposited on Pt(111)/Ti/SiO2/Si(100) and RuO2/SiO2/Si(100) substrates using metalorganic chemical vapor deposition (MOCVD). Atomic force microscopy revealed that films on ruthenium oxide were rougher than films on platinum. Also the grain size of the film on ruthenium oxide was larger than that on platinum. X-ray analysis revealed that the preferred orientations for films on platinum and ruthenium oxide were different. Hysteresis and fatigue tests were performed to evaluate capacitor structures on these substrates. Films on RuO2 had lower coercive fields than films on platinum. Comparison of polycrystalline and oriented films on platinum indicated that the oriented films were easier to switch and fatigued at a slower rate than the polycrystalline films. But long term property (fatigue, imprint) testing on lead titanate resulted in resistance degradation of these contacts, unlike PZT films.


Author(s):  
Karren L. More

Beta-SiC is an ideal candidate material for use in semiconductor device applications. Currently, monocrystalline β-SiC thin films are epitaxially grown on {100} Si substrates by chemical vapor deposition (CVD). These films, however, contain a high density of defects such as stacking faults, microtwins, and antiphase boundaries (APBs) as a result of the 20% lattice mismatch across the growth interface and an 8% difference in thermal expansion coefficients between Si and SiC. An ideal substrate material for the growth of β-SiC is α-SiC. Unfortunately, high purity, bulk α-SiC single crystals are very difficult to grow. The major source of SiC suitable for use as a substrate material is the random growth of {0001} 6H α-SiC crystals in an Acheson furnace used to make SiC grit for abrasive applications. To prepare clean, atomically smooth surfaces, the substrates are oxidized at 1473 K in flowing 02 for 1.5 h which removes ∽50 nm of the as-grown surface. The natural {0001} surface can terminate as either a Si (0001) layer or as a C (0001) layer.


2000 ◽  
Vol 87 (10) ◽  
pp. 7430-7437 ◽  
Author(s):  
Y. Gao ◽  
C. L. Perkins ◽  
S. He ◽  
P. Alluri ◽  
T. Tran ◽  
...  

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