Manipulation of Stresses in Metallic Thin Films by Alloying

1994 ◽  
Vol 356 ◽  
Author(s):  
A. S. Nandedkar
Keyword(s):  
Thin Films ◽  
Aluminum Alloy ◽  
Free Surface ◽  
Grain Boundary ◽  
Dislocation Core ◽  
Boundary Plane ◽  
Structural Defects ◽  
Atomistic Simulations ◽  
Metallic Thin Films ◽  
Copper Aluminum

AbstractAtomistic simulations were used to study the configurations of defects in copper aluminum alloy (2% copper, 98% aluminum). In the presence of free surface, the copper atoms migrated towards the surface. When the aluminum cell (about 2000 atoms) contained a dislocation, copper atoms segregated near the dislocation core on the compressional side. In presence of a grain boundary, copper atoms moved into the boundary plane. The segregation in these simulations resulted from reduction in localized strain near the structural defects.

scholarly journals GRAIN BOUNDARY MIGRATION IN THIN FILMS USING MONTE CARLO METHOD

Anales AFA ◽  
2020 ◽  
Vol 31 (1) ◽  
pp. 7-12
Author(s):  
C. L. Di Prinzio ◽  
P. I. Achával ◽  
D. Stoler ◽  
G. Aguirre Varela
Keyword(s):  
Thin Films ◽  
Monte Carlo ◽  
Free Surface ◽  
Monte Carlo Method ◽  
Grain Boundary ◽  
Boundary Migration ◽  
Grain Boundary Migration ◽  
Thin Sample ◽  
The Monte Carlo Method ◽  
Theoretical Results

This paper presents the evolution of a flat grain boundary in a thin sample, using a numerical algorithm based on the Monte Carlo method. The grain boundary is driven by an external force and the effect of the free surface is studied.The grain boundary migration on the free surface is spasmodic, which means that it has alternating periods of movement and stagnation. Stagnation periods are inversely proportional to the thickness of the sample. The results obtained computationally fitted acceptable with the theoretical results obtained by different authors.

Grain Boundary Plane Distributions in a Hot Rolled 5A06 Aluminum Alloy

2014 ◽  
Vol 16 (9) ◽  
pp. 1105-1110 ◽  
Author(s):  
Xiaokun Yuan ◽  
Kunyuan Gao ◽  
Gregory S. Rohrer ◽  
Xiaoying Fang
Keyword(s):  
Aluminum Alloy ◽  
Grain Boundary ◽  
Boundary Plane ◽  
Grain Boundary Plane ◽  
5A06 Aluminum Alloy ◽  
Hot Rolled

scholarly journals Grain boundary mediated plasticity: a blessing for the ductility of metallic thin films?

2021 ◽  
pp. 117079
Author(s):  
Jan P. Liebig ◽  
Mirza Mackovic ◽  
Erdmann Spiecker ◽  
Mathias Göken ◽  
Benoit Merle
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Metallic Thin Films

Grain Boundary Curvature in Polycrystalline Metallic Thin Films

2000 ◽  
Vol 615 ◽  
Author(s):  
Alexander H. King ◽  
Rakesh Mangat ◽  
Kwame Owusu-Boahen
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Film Thickness ◽  
Sheet Thickness ◽  
Film Plane ◽  
Thickness Effect ◽  
Metallic Thin Films ◽  
Boundary Curvature ◽  
Grain Boundary Grooves

ABSTRACTWell-annealed thin films are typically observed to exhibit mean grain diameters that are approximately equal to the film thickness. The standard explanation of this “sheet thickness effect” is that it results from a balance of grain boundary curvature in two different directions which, in turn, results from pinning at grain boundary grooves. TEM experiments have been performed to assess this model, and it is found that the predicted curvature about axes in the film plane is absent. Alternate explanations of the sheet thickness effect are considered.

Stress Effects on Al and Al(Cu) Thin Film Grain-Boundary Diffusion

1999 ◽  
Vol 594 ◽  
Author(s):  
X.-Y. Liu ◽  
C.-L. Liu
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Grain Boundary ◽  
Boundary Diffusion ◽  
Grain Boundary Diffusion ◽  
Atomistic Simulations ◽  
Stress Effects ◽  
Stress States ◽  
And Migration ◽  
Cu Thin Film

AbstractStress effects on grain-boundary diffusion in Al and Al(Cu) thin films are evaluated through atomistic simulations. Specifically, the grain-boundary vacancy formation and migration and interstitial migration energetics are obtained as a function of stress states in thin film. In general, the activation energies vary at a rate of 0.1 eV per 1.0 % strain at the grain boundary investigated, indicating the possible impact on electromigration phenomenon in these films.

Read-Shockley Boundaries in Thin Films

1997 ◽  
Vol 472 ◽  
Author(s):  
Alexander H. King
Keyword(s):  
Thin Films ◽  
Free Surface ◽  
Grain Boundary ◽  
Rotation Axis ◽  
Friction Stress ◽  
Surface Relaxation ◽  
Pinning Force ◽  
Triple Junctions ◽  
Axis Parallel ◽  
Interfacial Dislocations

ABSTRACTWhen a grain boundary is terminated by a free surface, its behavior may be significantly different than for the same boundary either in an infinite bicrystal, or terminated by triple junctions. In this paper we describe some phenomena related to the free-surface interactions of interfacial dislocations, in thin films. We show that surface relaxation stresses can exert a powerful destabilizing influence upon the dislocation structure of many grain boundaries, and that they can only be made stable if a large lattice friction stress, or other pinning force, resists the motion of the dislocations. Finally, we will show that the only intrinsically stable grain boundary in a thin film is a tilt boundary with its rotation axis parallel to the normal of the film.

Rocking Beam Microarea Diffraction Applied to Metallic thin Films

1976 ◽  
Vol 34 ◽  
pp. 396-397
Author(s):  
R. H. Geiss
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Small Area ◽  
Objective Lens ◽  
Electron Optics ◽  
Metallic Thin Films ◽  
Transmission Electron Diffraction ◽  
Transmission Electron ◽  
Sample Height ◽  
Scanning Transmission

The theory and practical limitations of micro area scanning transmission electron diffraction (MASTED) will be presented. It has been demonstrated that MASTED patterns of metallic thin films from areas as small as 30 Åin diameter may be obtained with the standard STEM unit available for the Philips 301 TEM. The key to the successful application of MASTED to very small area diffraction is the proper use of the electron optics of the STEM unit. First the objective lens current must be adjusted such that the image of the C2 aperture is quasi-stationary under the action of the rocking beam (obtained with 40-80-160 SEM settings of the P301). Second, the sample must be elevated to coincide with the C2 aperture image and its image also be quasi-stationary. This sample height adjustment must be entirely mechanical after the objective lens current has been fixed in the first step.

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