Real-Time Monitoring for Laser Surface Cleaning

1994 ◽  
Vol 354 ◽  
Author(s):  
Y.F. Lu ◽  
M.H. Hong ◽  
Y. Aoyagi

AbstractReal-time monitoring of surface cleanness in laser dry cleaning was investigated by monitoring the acoustic waves emitted from the substrate surface under pulsed laser irradiation. It is found that the acoustic wave from the surface under laser irradiation can reflect the surface condition, i.e., the surface cleanness. Besides the surface condition, the acoustic waveforms also depend on the substrate materials and laser pulse energies (intensities). The frequency spectrum obtained from the Fourier transform can provide clear indication for different surface cleanness. Removing of surface contaminants can generally result in weaker laser-induced acoustic wave and change in the frequency spectrum. The surface cleanness, therefore, can be monitored in real-time by detecting the amplitude and frequency of the acoustic wave during the laser cleaning process. This phenomenon provides the laser cleaning technique a real-time feedback during the cleaning process.

1998 ◽  
Vol 526 ◽  
Author(s):  
Y.F. Lu ◽  
M. Meng ◽  
M.H. Hong ◽  
T.S. Low ◽  
D.S.H. Chan

AbstractClosed-loop control and real-time monitoring of pulsed excimer laser cleaning and ablation have been realised by software and hardware design and development. The audible acoustic wave generated during excimer laser surface cleaning and ablation has been used as the feedback signal for the automatic control system of laser-surface interaction. Man–machine interface for laser operation and acoustic monitoring has been developed with LabVIEW 4.1 under Windows 95 environment. This system has been used to control and monitor laser cleaning and ablation processes in real-time and proven to successfully meet the requirements in our study. By database exchange, this automatic control system can also be applied to control drilling and materials removing.


1995 ◽  
Vol 34 (Part 2, No. 11B) ◽  
pp. L1557-L1560 ◽  
Author(s):  
Yong-Feng Lu ◽  
Yoshinobu Aoyagi

2015 ◽  
Vol 42 (1) ◽  
pp. 0104001
Author(s):  
王玲 Wang Ling ◽  
涂沛 Tu Pei ◽  
徐铭恩 Xu Ming′en

2006 ◽  
Vol 2006 ◽  
pp. 1-6 ◽  
Author(s):  
Marta Jasińska ◽  
Jørn Bredal-Jørgensen ◽  
Gerard Śliwiński

Changes of the elemental composition due to laser surface cleaning of a naturally crusted historical sandstone were investigated by means of the SEM/EDX technique. Data obtained for stone samples prior to and after laser irradiation were compared with those for noncrusted, reference ones. It has been observed that the crust removal resulting from ablative cleaning was accompanied by a decrease of the partial content of elements Al, S, K, Ca, and Mg in the range of 60–80% of their initial value recorded for the noncleaned, crust-covered stone surface. In the stone layer just under the crust coverage, a structure characterized by intergranular spaces between the SiO2 grains being the main sandstone component filled with degraded binder was observed. From the coincidence of the binder destruction and chemical composition of the crust, the stone surface destruction due to the long-term interaction of environmental pollution was deduced. The spatial distributions of individual elements obtained by mapping after laser irradiation indicated that besides SiO2 the content of elemental components in the sandstone surface layer decreased by 50%, whereas for Fe with the initial content of 4% and other surface remnants: P, Ti, Zn, and Cl—all below 1%, insignificant changes were only revealed. It was concluded in agreement with the literature that surface cleaning by means of the 1064 nm laser does not cause removal of iron from the sandstone surface.


2000 ◽  
Vol 39 (Part 1, No. 8) ◽  
pp. 4811-4813 ◽  
Author(s):  
Yong-Feng Lu ◽  
Wen-Dong Song ◽  
Ming-Hui Hong ◽  
Zhong-Min Ren ◽  
Qiong Chen ◽  
...  

2003 ◽  
Vol 31 (5) ◽  
pp. 342-347 ◽  
Author(s):  
Hiroyuki NAGATA ◽  
Manabu HEYA ◽  
Shu SANO ◽  
Takeyuki UCHIZONO ◽  
Yuichi HASHISHIN ◽  
...  

1997 ◽  
Author(s):  
Minghui Hong ◽  
Yongfeng Lu ◽  
Wen D. Song ◽  
Daming Liu ◽  
Tohsiew Low

2000 ◽  
Author(s):  
Yongfeng Lu ◽  
Wen D. Song ◽  
H. M. Hong ◽  
Yuan W. Zheng

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