Characterization of Polyimide Thin Films on Metals

1992 ◽  
Vol 264 ◽  
Author(s):  
Jiong-Ping Lu ◽  
Pradnya V. Nagarkar ◽  
David Volfson ◽  
Klavs F. Jensen ◽  
Stephen D. Senturia
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Ex Situ ◽  
Interfacial Region ◽  
Infrared Reflection Absorption Spectroscopy ◽  
Infrared Reflection ◽  
Polymer Curing ◽  
Tetracarboxylic Dianhydride

AbstractWe describe an approach using thin films on metals as models to study interfacial interactions. Thin films of biphenyl-tetracarboxylic dianhydride (BPDA) - p-phenylene diamine (PPD) based polyimide on Cr and Au surfaces have been investigated using infrared reflection absorption spectroscopy (IRRAS) and x-ray photoelectron spectroscopy (XPS). IRRAS was used for in-situ monitoring of polymer curing processes. Cured polyimide thin films on metals were characterized ex-situ by both XPS and IRRAS. Anhydride was observed to be an intermediate during chemical transformation of polyamic acid to polyimide. Imidization processes were found to be completed after curing at 250°C for thin films. Strong chemical modification of polyimide thin films resulting from interaction with Cr substrates were observed by infrared spectroscopy. These observations were consistent with angle-resolved XPS data showing a different C 1s emission spectrum of polyimide-Cr interfacial region, compared to the polyimide spectrum.

New approach in the monitoring and characterization of titanium nitride thin films

1999 ◽  
Vol 14 (2) ◽  
pp. 436-441 ◽  
Author(s):  
S. Logothetidis ◽  
E. I. Meletis ◽  
G. Kourouklis
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Ex Situ ◽  
New Approach ◽  
X Ray ◽  
Plasma Energy

In situ and ex situ spectroscopic ellipsometry (SE), Raman spectroscopy (RS), x-ray photoelectron spectroscopy (XPS), and Auger electron spectroscopy (AES) have been used to study the stoichiometry and characterize TiNx thin films deposited by magnetron sputtering at various stoichiometries. In situ SE can provide parameters, such as the plasma energy, that can be utilized for monitoring of the film stoichiometry. Besides plasma energy, optical phonon position in RS was also found to be a sensitive probe of TiNx stoichiometry as detected by RS, XPS, and ex situ SE. Under these conditions, AES faces difficulties for reliable film characterization, and the complementary use of other techniques is required for determining the exact film stoichiometry.

In situ and ex situ characterization of molybdenum thin films

2008 ◽  
Author(s):  
H. Khatri ◽  
J.D. Walker ◽  
J. Li ◽  
V. Ranjan ◽  
R.R. Khanal ◽  
...  
Keyword(s):  
Thin Films ◽  
Ex Situ

scholarly journals In-situ and ex-situ characterization of TiO2 and Au nanoparticle incorporated TiO2 thin films for optical gas sensing at extreme temperatures

2012 ◽  
Vol 111 (6) ◽  
pp. 064320 ◽  
Author(s):  
Paul R. Ohodnicki ◽  
Congjun Wang ◽  
Sittichai Natesakhawat ◽  
John P. Baltrus ◽  
Thomas D. Brown
Keyword(s):  
Thin Films ◽  
Gas Sensing ◽  
Ex Situ ◽  
Au Nanoparticle ◽  
Extreme Temperatures ◽  
Tio2 Thin Films ◽  
Optical Gas Sensing

Preparation and photoconductivity of PVP-CoPc self-assembled film

1998 ◽  
Vol 13 (12) ◽  
pp. 3550-3554 ◽  
Author(s):  
Min-Min Shi ◽  
Mang Wang ◽  
Hong-Zheng Chen
Keyword(s):  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Scanning Calorimetry ◽  
Infrared Reflection Absorption Spectroscopy ◽  
Infrared Reflection ◽  
New Type ◽  
Self Assembled ◽  
Oriented Parallel ◽  
Better Than

Through the complexation of cobalt phthalocyanine (CoPc) and a film of poly[4-vinyl- pyridine] (PVP) polarized by an electric field, a new type of preferentially oriented self-assembled film (PVP-CoPc) was obtained. The characterization of the film by differential scanning calorimetry (DSC), angle-dependent x-ray photoelectron spectroscopy (XPS), and Fourier transform infrared reflection absorption spectroscopy (FTIR-RAS) revealed that the planes of pyridine rings oriented perpendicular to the film surface, while the planes of phthalocyanine rings were oriented parallel with, and coordinated on, the film surface. Photoconductivity study showed that the photoconductivities of the photoreceptors (PR's) made from the PVP-CoPc self-assembled film were much better than those from CoPc alone. These changes were ascribed to the charge transfer and the unique and ordered structure of PVP-CoPc self-assembled film.

In situ and ex situ characterization of (Ag, Cu)InSe2 thin films

2011 ◽  
Author(s):  
T. Begou ◽  
S. A. Little ◽  
A. Aquino ◽  
V. Ranjan ◽  
A. Rockett ◽  
...  
Keyword(s):  
Thin Films ◽  
Ex Situ

Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy

1995 ◽  
Vol 90 (3) ◽  
pp. 283-287 ◽  
Author(s):  
S. Kennou ◽  
S. Ladas ◽  
E.C. Paloura ◽  
J.A. Kalomiros
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Ex Situ ◽  
X Ray ◽  
Amorphous Sic ◽  
Hydrogenated Amorphous

scholarly journals The in situ synthesis of PbS nanocrystals from lead(II) n -octylxanthate within a 1,3-diisopropenylbenzene–bisphenol A dimethacrylate sulfur copolymer

2017 ◽  
Vol 4 (8) ◽  
pp. 170383 ◽  
Author(s):  
P. D. McNaughter ◽  
J. C. Bear ◽  
A. G. Mayes ◽  
I. P. Parkin ◽  
P. O'Brien
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
Polymer Thin Film ◽  
X Ray ◽  
Pbs Nanocrystals ◽  
Nanocrystal Synthesis ◽  
New Generation

The synthesis of lead sulfide nanocrystals within a solution processable sulfur ‘inverse vulcanization’ polymer thin film matrix was achieved from the in situ thermal decomposition of lead(II) n -octylxanthate, [Pb(S 2 COOct) 2 ]. The growth of nanocrystals within polymer thin films from single-source precursors offers a faster route to networks of nanocrystals within polymers when compared with ex situ routes. The ‘inverse vulcanization’ sulfur polymer described herein contains a hybrid linker system which demonstrates high solubility in organic solvents, allowing solution processing of the sulfur-based polymer, ideal for the formation of thin films. The process of nanocrystal synthesis within sulfur films was optimized by observing nanocrystal formation by X-ray photoelectron spectroscopy and X-ray diffraction. Examination of the film morphology by scanning electron microscopy showed that beyond a certain precursor concentration the nanocrystals formed were not only within the film but also on the surface suggesting a loading limit within the polymer. We envisage this material could be used as the basis of a new generation of materials where solution processed sulfur polymers act as an alternative to traditional polymers.

Structural Characterization of Sputtered Fe70Pd30 Thin Films During Ex Situ and In Situ TEM Heating

2012 ◽  
Vol 14 (8) ◽  
pp. 716-723 ◽  
Author(s):  
Christoph Bechtold ◽  
Andriy Lotnyk ◽  
Burak Erkartal ◽  
Lorenz Kienle ◽  
Eckhard Quandt
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Ex Situ ◽  
In Situ Tem
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