scholarly journals In-situ and ex-situ characterization of TiO2 and Au nanoparticle incorporated TiO2 thin films for optical gas sensing at extreme temperatures

2012 ◽  
Vol 111 (6) ◽  
pp. 064320 ◽  
Author(s):  
Paul R. Ohodnicki ◽  
Congjun Wang ◽  
Sittichai Natesakhawat ◽  
John P. Baltrus ◽  
Thomas D. Brown
Keyword(s):  
Thin Films ◽  
Gas Sensing ◽  
Ex Situ ◽  
Au Nanoparticle ◽  
Extreme Temperatures ◽  
Tio2 Thin Films ◽  
Optical Gas Sensing

Oxygen gas sensing and microstructure characterization of sol-gel-prepared MoO3-TiO2 thin films

1999 ◽  
Author(s):  
Yongxiang Li ◽  
Muralihar K. Ghantasala ◽  
Kosmas Galatsis ◽  
Wojtek Wlodarski
Keyword(s):  
Thin Films ◽  
Gas Sensing ◽  
Sol Gel ◽  
Microstructure Characterization ◽  
Tio2 Thin Films ◽  
Oxygen Gas

In situ and ex situ characterization of molybdenum thin films

2008 ◽  
Author(s):  
H. Khatri ◽  
J.D. Walker ◽  
J. Li ◽  
V. Ranjan ◽  
R.R. Khanal ◽  
...  
Keyword(s):  
Thin Films ◽  
Ex Situ

Characterization of Polyimide Thin Films on Metals

1992 ◽  
Vol 264 ◽  
Author(s):  
Jiong-Ping Lu ◽  
Pradnya V. Nagarkar ◽  
David Volfson ◽  
Klavs F. Jensen ◽  
Stephen D. Senturia
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Ex Situ ◽  
Interfacial Region ◽  
Infrared Reflection Absorption Spectroscopy ◽  
Infrared Reflection ◽  
Polymer Curing ◽  
Tetracarboxylic Dianhydride

AbstractWe describe an approach using thin films on metals as models to study interfacial interactions. Thin films of biphenyl-tetracarboxylic dianhydride (BPDA) - p-phenylene diamine (PPD) based polyimide on Cr and Au surfaces have been investigated using infrared reflection absorption spectroscopy (IRRAS) and x-ray photoelectron spectroscopy (XPS). IRRAS was used for in-situ monitoring of polymer curing processes. Cured polyimide thin films on metals were characterized ex-situ by both XPS and IRRAS. Anhydride was observed to be an intermediate during chemical transformation of polyamic acid to polyimide. Imidization processes were found to be completed after curing at 250°C for thin films. Strong chemical modification of polyimide thin films resulting from interaction with Cr substrates were observed by infrared spectroscopy. These observations were consistent with angle-resolved XPS data showing a different C 1s emission spectrum of polyimide-Cr interfacial region, compared to the polyimide spectrum.

New approach in the monitoring and characterization of titanium nitride thin films

1999 ◽  
Vol 14 (2) ◽  
pp. 436-441 ◽  
Author(s):  
S. Logothetidis ◽  
E. I. Meletis ◽  
G. Kourouklis
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Ex Situ ◽  
New Approach ◽  
X Ray ◽  
Plasma Energy

In situ and ex situ spectroscopic ellipsometry (SE), Raman spectroscopy (RS), x-ray photoelectron spectroscopy (XPS), and Auger electron spectroscopy (AES) have been used to study the stoichiometry and characterize TiNx thin films deposited by magnetron sputtering at various stoichiometries. In situ SE can provide parameters, such as the plasma energy, that can be utilized for monitoring of the film stoichiometry. Besides plasma energy, optical phonon position in RS was also found to be a sensitive probe of TiNx stoichiometry as detected by RS, XPS, and ex situ SE. Under these conditions, AES faces difficulties for reliable film characterization, and the complementary use of other techniques is required for determining the exact film stoichiometry.

The Investigation of Microstructure Silicon NH3 Gas Sensors Based on Polyaniline Nano-Thin Films

2014 ◽  
Vol 998-999 ◽  
pp. 115-119
Author(s):  
Xiao Ying Xu ◽  
Hui Ling Tai ◽  
Chun Hua Liu ◽  
Guang Zhong Xie ◽  
Xiao Song Du
Keyword(s):  
Thin Films ◽  
Gas Sensors ◽  
Self Assembly ◽  
Gas Sensing ◽  
Sem Images ◽  
Interdigital Electrodes ◽  
Gas Sensing Properties ◽  
Response And Recovery

Polyaniline (PANI) nano-thin films were deposited on a novel microstructure silicon (MSS) substrate via in-situ self-assembly approach for NH3gas-sensing. The MSS was prepared by alkaline etching process, and gold interdigital electrodes were formed on the MSS surface by vacuum evaporation. The characterization of the MSS and PANI nanothin film were investigated by scanning electron microscope (SEM) and UV-Vis absorption spectroscopy. SEM images showed that the MSS exhibited an orderly uniform hemisphere array structure, and the MSS surface was covered by a compact PANI thin film which consists of PANI nanoparticles and PANI nanofibers. The gas-sensing properties of the sensor were examined at room temperature. The results revealed that the sensor exhibited a good response and recovery characteristics to NH3.

In situ and ex situ characterization of (Ag, Cu)InSe2 thin films

2011 ◽  
Author(s):  
T. Begou ◽  
S. A. Little ◽  
A. Aquino ◽  
V. Ranjan ◽  
A. Rockett ◽  
...  
Keyword(s):  
Thin Films ◽  
Ex Situ

Structural Characterization of Sputtered Fe70Pd30 Thin Films During Ex Situ and In Situ TEM Heating

2012 ◽  
Vol 14 (8) ◽  
pp. 716-723 ◽  
Author(s):  
Christoph Bechtold ◽  
Andriy Lotnyk ◽  
Burak Erkartal ◽  
Lorenz Kienle ◽  
Eckhard Quandt
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Ex Situ ◽  
In Situ Tem

In situ and ex situ characterization of thin films by soft X-ray emission spectroscopy

2000 ◽  
Vol 110-111 ◽  
pp. 41-67 ◽  
Author(s):  
Jinghua Guo ◽  
Per Skytt ◽  
Nial Wassdahl ◽  
Joseph Nordgren
Keyword(s):  
Thin Films ◽  
Emission Spectroscopy ◽  
Ex Situ ◽  
X Ray

In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films

2012 ◽  
Vol 18 (S2) ◽  
pp. 1462-1463
Author(s):  
M. Jablonski ◽  
C.R. Winkler ◽  
M.L. Taheri ◽  
A.R. Damodaran ◽  
J. Karthik ◽  
...  
Keyword(s):  
Thin Films ◽  
Bismuth Ferrite ◽  
Ex Situ ◽  
Wall Defect ◽  
Tem Characterization ◽  
Dc Bias ◽  
Ferrite Thin Films ◽  
Defect Interactions

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Ordered Thin Films of Perylenetetracarboxylicdianhydride-bisimide and bis-(N-alkyl)-Quinacridone Dyes

2000 ◽  
Vol 620 ◽  
Author(s):  
Andrew Back ◽  
Dana Alloway ◽  
Derck Schlettwein ◽  
Brook Schilling ◽  
J.-F. Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Alkali Halides ◽  
Layer Growth ◽  
Ex Situ ◽  
Layer By Layer ◽  
Molecular Plane ◽  
Layered Growth ◽  
Tapping Mode Afm

ABSTRACTWe review here the recent characterization of vacuum deposited monolayer and multilayer thin films of two different perylenetetracarboxylic-dianydride-bisimides (Cn-PTCDI; n =4,5), quinacridone, and two new bis-(N-alkyl)-quinacridone dyes (DIQA and DEHQA) on single crystal alkali halides using a combination of in situ luminescence spectroscopies and ex situ tapping mode AFM. Flat lying monolayer structures are indicated for PTCDA on the (100) faces of NaCl, KCl and KBr, for C4-PTCDI on KCl, for C5-PTCDI on both KCl and KBr and for DIQA on both KCl and KBr. Coherent thin films, exhibiting layer-by-layer growth can be achieved for PTCDA on all substrates, for C4-PTCDI on KCl and for DIQA on both KBr and KCl. Both C4-PTCDI and DIQA appear to fulfill the requirements for dyes which exhibit layered growth with the molecular plane inclined at steep angles to the surface normal.

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