Grating-Coupler Assisted Infrared Reflection Absorption Spectroscopy for the Characterization of Organic Thin Films

2006 ◽  
Vol 78 (20) ◽  
pp. 7335-7340 ◽  
Author(s):  
Bipin K. Singh ◽  
Andrew C. Hillier
2011 ◽  
Vol 20 (5-6) ◽  
pp. 733-742 ◽  
Author(s):  
Robert J. Hamers ◽  
Courtney Stavis ◽  
Ankit Pokhrel ◽  
Ryan Franking ◽  
Rose E. Ruther ◽  
...  

2009 ◽  
Vol 51 (1) ◽  
pp. 132-135 ◽  
Author(s):  
Harumi Sato ◽  
Rumi Murakami ◽  
Katsuhito Mori ◽  
Yuriko Ando ◽  
Isao Takahashi ◽  
...  

1992 ◽  
Vol 264 ◽  
Author(s):  
Jiong-Ping Lu ◽  
Pradnya V. Nagarkar ◽  
David Volfson ◽  
Klavs F. Jensen ◽  
Stephen D. Senturia

AbstractWe describe an approach using thin films on metals as models to study interfacial interactions. Thin films of biphenyl-tetracarboxylic dianhydride (BPDA) - p-phenylene diamine (PPD) based polyimide on Cr and Au surfaces have been investigated using infrared reflection absorption spectroscopy (IRRAS) and x-ray photoelectron spectroscopy (XPS). IRRAS was used for in-situ monitoring of polymer curing processes. Cured polyimide thin films on metals were characterized ex-situ by both XPS and IRRAS. Anhydride was observed to be an intermediate during chemical transformation of polyamic acid to polyimide. Imidization processes were found to be completed after curing at 250°C for thin films. Strong chemical modification of polyimide thin films resulting from interaction with Cr substrates were observed by infrared spectroscopy. These observations were consistent with angle-resolved XPS data showing a different C 1s emission spectrum of polyimide-Cr interfacial region, compared to the polyimide spectrum.


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