High-Aspect-Ratio Structures for MEMS

MRS Bulletin ◽  
2001 ◽  
Vol 26 (4) ◽  
pp. 307-308 ◽  
Author(s):  
Stella W. Pang

Many microelectromechanical systems (MEMS) use the changing capacitance of movable parallel plates to drive and sense motion. An increase in this capacitance improves the performance of these micromechanical structures by means of increased electromechanical coupling for lower driving voltages and increased sensitivity of the micromechanical motion.

2011 ◽  
Vol 22 (16) ◽  
pp. 1879-1886 ◽  
Author(s):  
Clark Andrews ◽  
Yirong Lin ◽  
Haixiong Tang ◽  
Henry A. Sodano

Piezoelectric ceramics offer exceptional sensing and actuation properties, however, they are prone to breakage and are difficult to apply to curved surfaces in their monolithic form. One method to alleviate these issues is through the use of 0–3 active composites, which are formed by embedding piezoelectric particles into a polymer matrix that protects the ceramic from breaking under mechanical loading. This class of material offers certain advantages over monolithic materials; however, they have seen little use due to the low electromechanical coupling offered by these materials. Here, we demonstrate that by controlling the aspect ratio of the filler, the electromechanical coupling coefficient can be significantly improved. For all volume fractions tested, nanocomposites with high aspect ratio lead nanowires filler had higher coupling with increases as large as 2.3 times. Furthermore, the nanocomposite’s coupling was more than 50% of the piezoceramic fillers’ when nanowires were used.


2003 ◽  
Vol 798 ◽  
Author(s):  
Dharanipal Doppalapudi ◽  
Richard Mlcak ◽  
Jeffrey Chan ◽  
Harry Tuller ◽  
Anirban Bhattacharya ◽  
...  

AbstractMiniaturized piezoelectric sensors based on Microelectromechanical Systems (MEMS) offer the advantages of reduced size, reduced power consumption, increased sensitivity coupled with the ability to form compact multi-sensor arrays. Fabrication of such sensors from single crystal materials further insure more highly reproducible and stable devices with improved performance. In this paper, we describe the integration of MBE grown AlN films onto photoelectrochemically machined SiC microcantilevers and membranes. AlN exhibits excellent piezoelectric properties, including an electromechanical coupling coefficient of 0.088 and a high in-plane acoustic velocity (∼5700m/sec) as well as excellent thermal-mechanical compatibility with SiC. The fabrication of AlN-SiC-based microresonators and flexural plate wave devices, and their application to chemical, biological and fluid sensing, are reported.


2005 ◽  
Vol 04 (04) ◽  
pp. 543-549 ◽  
Author(s):  
L. P. YEO ◽  
Y. C. LAM ◽  
MARY B. CHAN-PARK ◽  
S. C. JOSHI ◽  
D. E. HARDT

UV embossing for polymeric micro-patterning thin film is an emerging replication technique. This paper investigates UV curable multifunctional acrylates pre-polymer resin patterned by a micro-structured mold and subsequently cured by UV irradiation. To further enhance this duplication method for high aspect ratio production, demolding must be reliable and repeatable without damage to the embossing or mold. Previously, it has been reported that UV embossed patterns for aspect ratios as high as 14 have been achieved experimentally. Finite element analyses for patterns with aspect ratios of 5 using parallel demolding between two parallel plates have also been reported. However, the parallel demolding method may not be suitable for large area patterns as forces generated were high. As such, an alternative demolding method, namely peel demolding, for micro-patterns with an aspect ratio of 14 was investigated and key parameters identified. The parameters governing the demolding process were the peel angle, the pre-crack condition, shrinkage, interface fracture toughness, tensile strength and modulus of polymer. A pre-crack between the polymer and mold was introduced before peel demolding. Numerical analyses in terms of Cohesive Zone Modeling (CZM) were used to simulate the demolding process. Shrinkage caused by UV exposure was represented by thermal strain effects and the fully cured polymer was peeled off using displacement control. The ultimate tensile strength (U.T.S) of the cured polymer was used as a failure criterion. The stresses involved were crucial for determining clean demolding. As peeling progressed, stresses experienced in the polymer matrix increased rapidly in the region ahead of the crack with little or no stress at the cracked region. When stresses experienced by the polymer were below the U.T.S, demolding was deemed to be successful.


Materials ◽  
2019 ◽  
Vol 12 (13) ◽  
pp. 2056 ◽  
Author(s):  
Jae Man Park ◽  
Jong Hyun Kim ◽  
Jun Sae Han ◽  
Da Seul Shin ◽  
Sung Cheol Park ◽  
...  

In this study, a fabrication method of tapered microstructures with high aspect ratio was proposed by deep X-ray lithography. Tapered microstructures with several hundred micrometers and high aspect ratio are demanded owing to the high applicability in the fields of various microelectromechanical systems (MEMS) such as optical components and microfluidic channels. However, as the pattern and gap size were downsized to smaller micro-scale with higher aspect ratio over 5, microstructures were easily deformed or clustered together due to capillary force during the drying process. Here, we describe a novel manufacturing process of tapered microstructures with high aspect ratio. To selectively block the deep X-ray irradiation, an X-ray mask was prepared via conventional ultraviolet (UV) lithography. A double X-ray exposure process with and without X-ray mask was applied to impose a two-step dose distribution on a photoresist. For the clear removal of the exposed region, the product was developed in the downward direction, which encourages a gravity-induced pulling force as well as a convective transport of the developer. After a drying process with the surface additive, tapered microstructures were successfully fabricated with a pattern size of 130 μm, gap size of 40 μm, and aspect ratio over 7.


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