Optical Techniques for the Determination of Pulsed Laser Damage in Thin Films

2009 ◽  
pp. 226-226-9
Author(s):  
TW Walker ◽  
AH Guenther ◽  
PE Nielsen
Keyword(s):  
Thin Films ◽  
Pulsed Laser ◽  
Laser Damage ◽  
Optical Techniques

O12.6 Fracture and Deformation of Thermal Oxide Films on Si (100) Using a Femtosecond Pulsed Laser

2005 ◽  
Vol 875 ◽  
Author(s):  
Joel P. McDonald ◽  
Vanita R. Mistry ◽  
Katherine E. Ray ◽  
Steven M. Yalisove
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Pulsed Laser ◽  
Damage Threshold ◽  
Laser Pulses ◽  
The Other ◽  
Laser Damage ◽  
Optical And Electrical Properties ◽  
Thermal Oxide ◽  
Femtosecond Pulsed Laser

AbstractFemtosecond pulsed laser damage of Silicon (100) with thermal oxide thin films was studied in order to further understand the optical and electrical properties of thin films and to evaluate their influence on the damage of the substrate. The damage threshold as a function of film thickness (2 – 1200 nm) was measured. The damage morphology produced by single laser pulses was also investigated. Two primary morphologies were observed, one in which the oxide film is completely removed, and the other in which the film is delaminated and expanded above the surface producing a bubble feature.

On the determination of anisotropy in polymer thin films: A comparative study of optical techniques

2008 ◽  
Vol 5 (5) ◽  
pp. 1270-1273 ◽  
Author(s):  
M. Campoy-Quiles ◽  
J. Nelson ◽  
P. G. Etchegoin ◽  
D. D. C. Bradley ◽  
V. Zhokhavets ◽  
...  
Keyword(s):  
Thin Films ◽  
Comparative Study ◽  
Polymer Thin Films ◽  
Optical Techniques

Determination of the critical thickness for the onset of porosity in pulsed-laser deposited thin films of MoS2

1993 ◽  
Author(s):  
S. D. Walck ◽  
J. S. Zabinski ◽  
M. S. Donley ◽  
A. E. Day ◽  
J. E. Bultman
Keyword(s):  
Thin Films ◽  
Critical Thickness ◽  
Pulsed Laser

scholarly journals Determination of Oxygen Content in Pulsed Laser Deposited InN Thin Films with Analytical Electron Microscopy

2009 ◽  
Vol 15 (S2) ◽  
pp. 1316-1317
Author(s):  
G Drazic ◽  
E Sarantopoulou ◽  
Z Kollia ◽  
A-C Cefalas ◽  
S Kobe
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Oxygen Content ◽  
Analytical Electron Microscopy ◽  
Pulsed Laser ◽  
Analytical Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Determination of the Young's modulus of pulsed laser deposited epitaxial PZT thin films

2011 ◽  
Vol 21 (7) ◽  
pp. 074008 ◽  
Author(s):  
H Nazeer ◽  
M D Nguyen ◽  
L A Woldering ◽  
L Abelmann ◽  
G Rijnders ◽  
...  
Keyword(s):  
Thin Films ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Pulsed Laser ◽  
Pzt Thin Films
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