In-Plane and Out-of-Plane Coefficient of Thermal Expansion Characterization of New High-Performance Printed Circuit Boards Using Dilatometer and Thermomechanical Analysis

Author(s):  
AM Ibrahim ◽  
ML Klemens ◽  
TF Cozzo
1982 ◽  
Vol 1 (1) ◽  
pp. 38-43 ◽  
Author(s):  
D. Fishman ◽  
N. Cooper

It is reasoned that wide penetration of chip carriers into equipment for professional and commercial applications depends on developing methods for mounting the leadless types directly on to conventional polymer type printed circuit boards. The main problem to be overcome is fatigue failure of the solder joints due to the mismatch in thermal expansion, evidenced by poor thermal cycling performance. In this paper the thermal cycling performance is compared when four sizes of ceramic leadless chip carrier are mounted on a selection of printed circuit board materials ranging from the conventional to those specially formulated, either on the basis of matching the coefficient of thermal expansion of the chip carrier material, or to provide a layer of compliant elastomer material underneath the layer bearing the copper contact layer, so that strain due to thermal expansion mismatch is not transmitted to the solder layer. Over 400 thermal cycles (−55 to + 125°C) were recorded using proprietary versions of elastomer coated substrates. For appropriate applications the basis is thus laid for an economic and technically acceptable solution. The practical implications of two methods of soldering—wave (jet) and vapour phase—are also discussed.


1995 ◽  
Vol 390 ◽  
Author(s):  
Wendy W. Lin ◽  
Ender Savrun

ABSTRACTAdhesive failure of rigid-flex printed circuit boards (RF-PCBs) during use has degraded the performance of military avionics systems. Adhesive failure is often caused by differences in the coefficient of thermal expansion (CTE) between the materials used in RF-PCBs and by moisture absorption by the adhesives and polyimide (PI) films. High-performance thermoplastics were investigated to replace the epoxies, PIs, and adhesives currently used in RF-PCBs. Because thermoplastic materials are remeltable, adhesive bonding may be replaced by fusion bonding to join RF-PCBs. Fusion bonding would eliminate problems with material compatibility and differences in the CTE encountered with adhesive bonding. Industries that would benefit from this research are manufacturers of aerospace instrumentation, medical equipment, automotive systems, computers, telecommunications equipment, industrial instrumentation and controls, and consumer products, such as stereo systems and calculators.An extensive survey of high-performance-engineering thermoplastic materials was performed, and samples of the more promising materials (both films and chopped fiber reinforced) were obtained for preliminary screening tests. The tests performed were chemical resistance, water absorption, tensile strength, flexibility, and solder resistance of bare dielectric. From these tests, a glass-filled liquid crystal polymer film made by Hoescht Celanese Performance Films best met the performance criteria compared with the thermoplastics tested.


2001 ◽  
Author(s):  
Paul A. Kohl ◽  
Sue Ann Bidstrup Allen

Abstract Thin films of dielectric materials are used as insulating layers in microelectronic systems, including integrated circuits and printed circuit boards. Polymer and spin-on-glasses are widely used as coatings and interlevel dielectrics. The dielectric permitivity and loss are the electrical properties of most interest. However, characterization and optimization of the mechanical properties is essential to the successful implementation and usage of these insulators. In this presentation, thin-film structures for measuring direction-dependent properties (dielectric constant, elastic modulus, and coefficient of thermal expansion), and nano-indentation results on spin-on-glass materials will be presented. Significant improvement in the fracture toughness of nanoporous methylsilsesquioxane glass films has been demonstrated upon introduction of porosity into the films.


2018 ◽  
Vol 2018 (1) ◽  
pp. 000305-000309 ◽  
Author(s):  
Shiro Tatsumi ◽  
Shohei Fujishima ◽  
Hiroyuki Sakauchi

Abstract Build-up process is a highly effective method for miniaturization and high density integration of printed circuit boards. Along with increasing demands for high transmission speed of electronic devices with high functionality, packaging substrates installed with semiconductors in such devices are strongly required to reduce the transmission loss. Our insulation materials are used in a semi-additive process (SAP) with low dielectric loss tangent, smooth resin surface after desmear, and good insulation reliability. Actually, the transmission loss of strip line substrates and Cu surface roughness impact on transmission loss were measured using our materials. Furthermore, low dielectric molding film with low coefficient of thermal expansion (CTE) and low Young's modulus are introduced.


2014 ◽  
Vol 2014 (1) ◽  
pp. 000444-000447 ◽  
Author(s):  
Yoshio Nishimura ◽  
Hirohisa Narahashi ◽  
Shigeo Nakamura ◽  
Tadahiko Yokota

Printed circuit boards manufactured by a semi-additive process are widely used for packaging substrates. Along with increasing demands of downsizing electronic devices with high functionality, packaging substrates installed with semiconductors in such devices are strongly required to be miniaturized with high density of circuit wirings. We report our insulation build-up materials and processes for advanced packages with fine line/space and high reliability. The insulation materials we developed show low coefficient of thermal expansion (CTE), low dielectric loss tangent and good thinner insulation reliability. They can produce fine line and space (FLS) under 10μm pitch by a semi-additive process.


2016 ◽  
Vol 65 (8) ◽  
pp. 1827-1835 ◽  
Author(s):  
Marco Lorenzo Valerio Tagliaferri ◽  
Alessandro Crippa ◽  
Simone Cocco ◽  
Marco De Michielis ◽  
Marco Fanciulli ◽  
...  

2005 ◽  
Vol 127 (4) ◽  
pp. 370-374 ◽  
Author(s):  
X. B. Chen

In electronics packaging, one of the key processes is dispensing fluid materials, such as adhesive, epoxy, encapsulant, onto substrates or printed circuit boards for the purpose of surface mounting or encapsulation. In order to precisely control the dispensing process, the understanding and characterization of the flow behavior of the fluid being dispensed is very important, as the behavior can have a significant influence on the dispensing process. However, this task has proven to be very challenging due to the fact that the fluids for electronics packaging usually exhibit the time-dependent rheological behavior, which has not been well defined in literature. In the paper a study on the characterization of the time-dependent rheological behavior of the fluids for electronics packaging is presented. In particular, a model is developed based on structural theory and then applied to the characterization of the decay and recovery of fluid behavior, which happen in the dispensing process due to the interruption of process. Experiments are carried out to verify the effectiveness of the model developed.


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