Magnetic Domain Structures in Fe-3.2Si Revealed by Scanning Electron Microscopy—A Photo Essay

1975 ◽  
Vol 3 (1) ◽  
pp. 75 ◽  
Author(s):  
SF Etris ◽  
YR Fiorini ◽  
KC Lieb ◽  
IC Moore ◽  
AL Batik ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Magnetic Domain ◽  
Domain Structures ◽  
Photo Essay ◽  
Scanning Electron

High Voltage Scanning Electron Microscopy for Observing Magnetic Domains

1975 ◽  
Vol 33 ◽  
pp. 32-33
Author(s):  
T. Yamamoto ◽  
K. Tsuno ◽  
H. Nishizawa
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Voltage ◽  
Magnetic Domain ◽  
Glass Film ◽  
Magnetic Domains ◽  
Sem Image ◽  
Domain Structures ◽  
Voltage Scanning ◽  
Scanning Electron

Magnetic domain contrast in a SEM image of cubic ferromagnetic materials enhances with increasing accelerating voltage. It was shown that a high voltage SEM was effective for observing the domain structure in a very small saturation magnetization material. It is however known that the high voltage SEM observation is not so desirable because of increased electron diffusion. Thus further investigations are still needed. By utilizing a 200 kV SEM, JSEM-200, with the backscattered mode, we have found that the increased accelerating voltage results not only in the enhancement of magnetic contrast but also in a great reduction of topographical contrast caused by the surface projections as well as that of electron channeling contrast (see Figs. 1 and 2). Moreover we successfully observed the domain structures of a Goss-oriented 3% Si-Fe sheet whose surface was covered by an insulator (like glass) film of 4.5 μm in thickness (see Fig. 3). The domains were clearly observed at 200 kV but unobservable at 100 kV. These features are particularly useful for studying the domain structures in the practical materials.

scholarly journals Magnetization Analysis by Spin-Polarized Scanning Electron Microscopy

Scanning ◽  
2018 ◽  
Vol 2018 ◽  
pp. 1-6
Author(s):  
Teruo Kohashi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Review Paper ◽  
Magnetic Domain ◽  
Secondary Electrons ◽  
Domain Structures ◽  
Resolution Measurement ◽  
Spin Polarized ◽  
Magnetization Orientation ◽  
Scanning Electron

Spin-polarized scanning electron microscopy (spin SEM) is a method for observing magnetic-domain structures by detecting the spin polarization of secondary electrons. It has several unique abilities such as detection of full magnetization orientation and high-spatial-resolution measurement. Several spin-SEM experiments have demonstrated that it is a promising method for studying various types of magnetic materials and devices. This review paper presents several spin-SEM observations to demonstrate the capability and potential of spin SEM.

Magnetic Domain Imaging of Epitaxial thin Films by Spin-Polarized Scanning Electron Microscopy

1991 ◽  
Vol 231 ◽  
Author(s):  
R. Allenspach ◽  
M. Stampanoni
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Magnetic Domain ◽  
Domain Size ◽  
Epitaxial Thin Films ◽  
Continuous Rotation ◽  
Spin Polarized ◽  
Out Of Plane ◽  
Micrometer Size ◽  
Scanning Electron

AbstractThe formation of magnetic domains in thin epitaxial Co/Au(111) films is investigated by spin-polarized scanning electron microscopy. Three-monolayer films are shown to decay into out-of-plane domains of micrometer size. The transition from out-of-plane to in-plane magnetization at a crossover thickness of 4.5 layers is followed by imaging the domains, and the transition is shown to occur as a continuous rotation of the magnetization. The domain size in field-free-grown perpendicular films depends linearly on film thickness. From high-resolution line scans across magnetization reversals we determine the resolution in magnetic imaging to be better than 40 nm.

Scanning electron microscopy with polarization analysis: An update

1991 ◽  
Vol 49 ◽  
pp. 764-765
Author(s):  
J. Unguris ◽  
M. W. Hart ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Domain Walls ◽  
Domain Wall Motion ◽  
Optical Recording ◽  
Polarization Analysis ◽  
Magnetic Domains ◽  
Magnetic Microstructure ◽  
Domain Structures ◽  
Scanning Electron

Over the past ten years the technique of scanning electron microscopy with polarization analysis (SEMPA) has rapidly evolved from a scientific curiosity to a useful analytical tool for looking at a material's magnetic microstructure. Several reviews of the technique have been published elsewhere. SEMPA has been successfully used to analyze various technological problems such as: noise in magnetic and magneto-optical recording media, domain wall motion in thin film recording heads, and domain structures in small Permalloy shapes. Basic science applications of SEMPA include quantitative studies of the influence of the surface on the structure of magnetic domains and domain walls, and studies of magnetic microstructures in ultra-thin (0.1 - 1 nm) ferromagnetic films. Many current applications of SEMPA make use of the technique's surface sensitivity to probe the magnetism of thin films and multilayers.

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