Magnetic Domain Imaging of Epitaxial thin Films by Spin-Polarized Scanning Electron Microscopy

1991 ◽  
Vol 231 ◽  
Author(s):  
R. Allenspach ◽  
M. Stampanoni
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Magnetic Domain ◽  
Domain Size ◽  
Epitaxial Thin Films ◽  
Continuous Rotation ◽  
Spin Polarized ◽  
Out Of Plane ◽  
Micrometer Size ◽  
Scanning Electron

AbstractThe formation of magnetic domains in thin epitaxial Co/Au(111) films is investigated by spin-polarized scanning electron microscopy. Three-monolayer films are shown to decay into out-of-plane domains of micrometer size. The transition from out-of-plane to in-plane magnetization at a crossover thickness of 4.5 layers is followed by imaging the domains, and the transition is shown to occur as a continuous rotation of the magnetization. The domain size in field-free-grown perpendicular films depends linearly on film thickness. From high-resolution line scans across magnetization reversals we determine the resolution in magnetic imaging to be better than 40 nm.

scholarly journals Magnetization Analysis by Spin-Polarized Scanning Electron Microscopy

Scanning ◽  
2018 ◽  
Vol 2018 ◽  
pp. 1-6
Author(s):  
Teruo Kohashi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Review Paper ◽  
Magnetic Domain ◽  
Secondary Electrons ◽  
Domain Structures ◽  
Resolution Measurement ◽  
Spin Polarized ◽  
Magnetization Orientation ◽  
Scanning Electron

Spin-polarized scanning electron microscopy (spin SEM) is a method for observing magnetic-domain structures by detecting the spin polarization of secondary electrons. It has several unique abilities such as detection of full magnetization orientation and high-spatial-resolution measurement. Several spin-SEM experiments have demonstrated that it is a promising method for studying various types of magnetic materials and devices. This review paper presents several spin-SEM observations to demonstrate the capability and potential of spin SEM.

Spin-polarized Scanning Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 768-769
Author(s):  
Kazuyuki Koike ◽  
Hideo Matsuyama
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Speed ◽  
Magnetic Thin Films ◽  
Electron Spin Polarization ◽  
Acquisition Time ◽  
Magnetization Direction ◽  
Spin Polarized ◽  
Conventional Methods ◽  
Scanning Electron

Spin-polarized scanning electron microscopy (spin SEM), where the secondary electron spin polarization is used as the image signal, is a novel technique for magnetic domain observation. Since its first development by Koike and Hayakawa in 1984, several laboratories have extensively studied this technique and have greatly improved its capability for data extraction and its range of applications. This paper reviews the progress over the last few years.Almost all the high expectations initially held for spin SEM have been realized. A spatial resolution of several hundreds angstroms has been attained, which is nearly one order of magnitude higher than that of conventional methods for thick samples. Quantitative analysis of magnetization direction has been performed more easily than with conventional methods. Domain observation of the surface of three-dimensional samples has been confirmed to be possible. One of the drawbacks, a long image acquisition time, has been eased by combining highspeed image-signal processing with high speed scanning, although at the cost of image quality. By using spin SEM, the magnetic structure of a 180 degrees surface Neel wall, magnetic thin films, multilayered films, magnetic discs, etc., have been investigated.

Scanning electron microscopy with spin polarized electrons (invited) (abstract)

1987 ◽  
Vol 61 (8) ◽  
pp. 4307-4307 ◽  
Author(s):  
J. Unguris ◽  
G. G. Hembree ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Polarized Electrons ◽  
Spin Polarized ◽  
Scanning Electron
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