scholarly journals Magnetization Analysis by Spin-Polarized Scanning Electron Microscopy

Scanning ◽  
2018 ◽  
Vol 2018 ◽  
pp. 1-6
Author(s):  
Teruo Kohashi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Review Paper ◽  
Magnetic Domain ◽  
Secondary Electrons ◽  
Domain Structures ◽  
Resolution Measurement ◽  
Spin Polarized ◽  
Magnetization Orientation ◽  
Scanning Electron

Spin-polarized scanning electron microscopy (spin SEM) is a method for observing magnetic-domain structures by detecting the spin polarization of secondary electrons. It has several unique abilities such as detection of full magnetization orientation and high-spatial-resolution measurement. Several spin-SEM experiments have demonstrated that it is a promising method for studying various types of magnetic materials and devices. This review paper presents several spin-SEM observations to demonstrate the capability and potential of spin SEM.

Magnetic Domain Imaging of Epitaxial thin Films by Spin-Polarized Scanning Electron Microscopy

1991 ◽  
Vol 231 ◽  
Author(s):  
R. Allenspach ◽  
M. Stampanoni
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Magnetic Domain ◽  
Domain Size ◽  
Epitaxial Thin Films ◽  
Continuous Rotation ◽  
Spin Polarized ◽  
Out Of Plane ◽  
Micrometer Size ◽  
Scanning Electron

AbstractThe formation of magnetic domains in thin epitaxial Co/Au(111) films is investigated by spin-polarized scanning electron microscopy. Three-monolayer films are shown to decay into out-of-plane domains of micrometer size. The transition from out-of-plane to in-plane magnetization at a crossover thickness of 4.5 layers is followed by imaging the domains, and the transition is shown to occur as a continuous rotation of the magnetization. The domain size in field-free-grown perpendicular films depends linearly on film thickness. From high-resolution line scans across magnetization reversals we determine the resolution in magnetic imaging to be better than 40 nm.

High Voltage Scanning Electron Microscopy for Observing Magnetic Domains

1975 ◽  
Vol 33 ◽  
pp. 32-33
Author(s):  
T. Yamamoto ◽  
K. Tsuno ◽  
H. Nishizawa
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Voltage ◽  
Magnetic Domain ◽  
Glass Film ◽  
Magnetic Domains ◽  
Sem Image ◽  
Domain Structures ◽  
Voltage Scanning ◽  
Scanning Electron

Magnetic domain contrast in a SEM image of cubic ferromagnetic materials enhances with increasing accelerating voltage. It was shown that a high voltage SEM was effective for observing the domain structure in a very small saturation magnetization material. It is however known that the high voltage SEM observation is not so desirable because of increased electron diffusion. Thus further investigations are still needed. By utilizing a 200 kV SEM, JSEM-200, with the backscattered mode, we have found that the increased accelerating voltage results not only in the enhancement of magnetic contrast but also in a great reduction of topographical contrast caused by the surface projections as well as that of electron channeling contrast (see Figs. 1 and 2). Moreover we successfully observed the domain structures of a Goss-oriented 3% Si-Fe sheet whose surface was covered by an insulator (like glass) film of 4.5 μm in thickness (see Fig. 3). The domains were clearly observed at 200 kV but unobservable at 100 kV. These features are particularly useful for studying the domain structures in the practical materials.

Magnetic Domain Structures in Fe-3.2Si Revealed by Scanning Electron Microscopy—A Photo Essay

1975 ◽  
Vol 3 (1) ◽  
pp. 75 ◽  
Author(s):  
SF Etris ◽  
YR Fiorini ◽  
KC Lieb ◽  
IC Moore ◽  
AL Batik ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Magnetic Domain ◽  
Domain Structures ◽  
Photo Essay ◽  
Scanning Electron

Imaging magnetic microstructure with SEMPA

1993 ◽  
Vol 51 ◽  
pp. 1032-1033
Author(s):  
M. H. Kelley ◽  
J. Unguris ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Sandwich Structure ◽  
Magnetic Coupling ◽  
Polarization Analysis ◽  
Secondary Electrons ◽  
Magnetic Microstructure ◽  
Escape Depth ◽  
Scanning Electron

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.

Spin-polarized Scanning Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 768-769
Author(s):  
Kazuyuki Koike ◽  
Hideo Matsuyama
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Speed ◽  
Magnetic Thin Films ◽  
Electron Spin Polarization ◽  
Acquisition Time ◽  
Magnetization Direction ◽  
Spin Polarized ◽  
Conventional Methods ◽  
Scanning Electron

Spin-polarized scanning electron microscopy (spin SEM), where the secondary electron spin polarization is used as the image signal, is a novel technique for magnetic domain observation. Since its first development by Koike and Hayakawa in 1984, several laboratories have extensively studied this technique and have greatly improved its capability for data extraction and its range of applications. This paper reviews the progress over the last few years.Almost all the high expectations initially held for spin SEM have been realized. A spatial resolution of several hundreds angstroms has been attained, which is nearly one order of magnitude higher than that of conventional methods for thick samples. Quantitative analysis of magnetization direction has been performed more easily than with conventional methods. Domain observation of the surface of three-dimensional samples has been confirmed to be possible. One of the drawbacks, a long image acquisition time, has been eased by combining highspeed image-signal processing with high speed scanning, although at the cost of image quality. By using spin SEM, the magnetic structure of a 180 degrees surface Neel wall, magnetic thin films, multilayered films, magnetic discs, etc., have been investigated.

Spin-Polarized Scanning Electron Microscope for Analysis of Complicated Magnetic Domain Structures

1986 ◽  
Vol 25 (Part 2, No. 9) ◽  
pp. L758-L760 ◽  
Author(s):  
Kazuyuki Koike ◽  
Hideo Matsuyama ◽  
Katsuya Mitsuoka ◽  
Kazunobu Hayakawa
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Magnetic Domain ◽  
Domain Structures ◽  
Spin Polarized ◽  
Scanning Electron
Sign in / Sign up

Export Citation Format

Share Document