Standard Test Method for:Determining the Mean Interface Trap Density of MOSFETs by Charge-Pumping (Discontinued 1997)

10.1520/f1340 ◽  
1997 ◽  
Author(s):  
Keyword(s):  
Standard Test ◽  
Test Method ◽  
Trap Density ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Charge Pumping ◽  
Standard Test Method ◽  
The Mean

Charge Pumping Measurements of Radiation-Induced Interface-Trap Density in Floating-Body SOI FinFETs

2012 ◽  
Vol 59 (6) ◽  
pp. 3062-3068 ◽  
Author(s):  
E. X. Zhang ◽  
D. M. Fleetwood ◽  
G. X. Duan ◽  
C. X. Zhang ◽  
S. A. Francis ◽  
...  
Keyword(s):  
Trap Density ◽  
Floating Body ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Charge Pumping ◽  
Radiation Induced

Analysis of the Interface Trap Density in SOI FinFETs with Different TiN Gate Electrode Thickness through Charge Pumping Technique

2019 ◽  
Vol 23 (1) ◽  
pp. 559-565 ◽  
Author(s):  
Michele Rodrigues ◽  
Moon Cho ◽  
João A. Martino ◽  
Nadine Collaert ◽  
Abdelkarim Mercha ◽  
...  
Keyword(s):  
Trap Density ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Gate Electrode ◽  
Electrode Thickness ◽  
Charge Pumping

The determination of Si-SiO/sub 2/ interface trap density in irradiated four-terminal VDMOSFETs using charge pumping

1996 ◽  
Vol 43 (6) ◽  
pp. 2558-2564 ◽  
Author(s):  
S.C. Witczak ◽  
K.F. Galloway ◽  
R.D. Schrimpf ◽  
J.L. Titus ◽  
J.R. Brews ◽  
...  
Keyword(s):  
Trap Density ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Charge Pumping
Sign in / Sign up

Export Citation Format

Share Document