Effects of Fowler-Nordheim stress on interface trap density and emission cross sections in n-MOSFETs studied by three-level charge pumping

1996 ◽  
Vol 17 (5) ◽  
pp. 239-241 ◽  
Author(s):  
Xiao-Jie Yuan ◽  
M. Kivi ◽  
S. Taylor ◽  
P. Hurley
Keyword(s):  
Cross Sections ◽  
Trap Density ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Charge Pumping

Charge Pumping Measurements of Radiation-Induced Interface-Trap Density in Floating-Body SOI FinFETs

2012 ◽  
Vol 59 (6) ◽  
pp. 3062-3068 ◽  
Author(s):  
E. X. Zhang ◽  
D. M. Fleetwood ◽  
G. X. Duan ◽  
C. X. Zhang ◽  
S. A. Francis ◽  
...  
Keyword(s):  
Trap Density ◽  
Floating Body ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Charge Pumping ◽  
Radiation Induced

Analysis of the Interface Trap Density in SOI FinFETs with Different TiN Gate Electrode Thickness through Charge Pumping Technique

2019 ◽  
Vol 23 (1) ◽  
pp. 559-565 ◽  
Author(s):  
Michele Rodrigues ◽  
Moon Cho ◽  
João A. Martino ◽  
Nadine Collaert ◽  
Abdelkarim Mercha ◽  
...  
Keyword(s):  
Trap Density ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Gate Electrode ◽  
Electrode Thickness ◽  
Charge Pumping

The determination of Si-SiO/sub 2/ interface trap density in irradiated four-terminal VDMOSFETs using charge pumping

1996 ◽  
Vol 43 (6) ◽  
pp. 2558-2564 ◽  
Author(s):  
S.C. Witczak ◽  
K.F. Galloway ◽  
R.D. Schrimpf ◽  
J.L. Titus ◽  
J.R. Brews ◽  
...  
Keyword(s):  
Trap Density ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Charge Pumping

Analyzing the interface trap density in SiGe capacitors using an abnormal flat band voltage shift at low temperature

2020 ◽  
Vol 13 (11) ◽  
pp. 111006
Author(s):  
Li-Chuan Sun ◽  
Chih-Yang Lin ◽  
Po-Hsun Chen ◽  
Tsung-Ming Tsai ◽  
Kuan-Ju Zhou ◽  
...  
Keyword(s):  
Low Temperature ◽  
Trap Density ◽  
Flat Band ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Flat Band Voltage ◽  
Voltage Shift
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