Three-Dimensional Nanothermometry Below The Diffraction Limit

2021 ◽  
Author(s):  
Jonas Thiem ◽  
Simon Spelthann ◽  
Joerg Neumann ◽  
Axel Ruehl ◽  
Detlev Ristau
Keyword(s):  
Three Dimensional ◽  
Diffraction Limit

Three-dimensional acoustic sub-diffraction focusing by coiled metamaterials with strong absorption

2019 ◽  
Vol 7 (17) ◽  
pp. 5131-5138 ◽  
Author(s):  
Fuyin Ma ◽  
Jianyu Chen ◽  
Jiu Hui Wu
Keyword(s):  
Focal Spot ◽  
Three Dimensional ◽  
Homogeneous Medium ◽  
Diffraction Limit ◽  
Strong Absorption ◽  
Operating Wavelength

The diffraction limit restricts the smallest diameter of a wave's focal spot in a homogeneous medium to no less than half of the operating wavelength.

scholarly journals 3D Photonic Nanostructures via Diffusion-Assisted Direct fs Laser Writing

2012 ◽  
Vol 2012 ◽  
pp. 1-6 ◽  
Author(s):  
Gabija Bickauskaite ◽  
Maria Manousidaki ◽  
Konstantina Terzaki ◽  
Elmina Kambouraki ◽  
Ioanna Sakellari ◽  
...  
Keyword(s):  
Electroless Plating ◽  
Metal Binding ◽  
Three Dimensional ◽  
Diffraction Limit ◽  
Metallic Surface ◽  
Direct Laser Writing ◽  
Laser Writing ◽  
Inorganic Hybrid ◽  
Direct Laser ◽  
Fs Laser

We present our research into the fabrication of fully three-dimensional metallic nanostructures using diffusion-assisted direct laser writing, a technique which employs quencher diffusion to fabricate structures with resolution beyond the diffraction limit. We have made dielectric 3D nanostructures by multiphoton polymerization using a metal-binding organic-inorganic hybrid material, and we covered them with silver using selective electroless plating. We have used this method to make spirals and woodpiles with 600 nm intralayer periodicity. The resulting photonic nanostructures have a smooth metallic surface and exhibit well-defined diffraction spectra, indicating good fabrication quality and internal periodicity. In addition, we have made dielectric woodpile structures decorated with gold nanoparticles. Our results show that diffusion-assisted direct laser writing and selective electroless plating can be combined to form a viable route for the fabrication of 3D dielectric and metallic photonic nanostructures.

Sub-Diffraction Limit Three Dimensional Particle Tracking Velocimetry

2013 ◽  
Author(s):  
Craig A. Snoeyink ◽  
Gordon Christopher ◽  
Sourav Barman ◽  
Steve Wereley
Keyword(s):  
Imaging System ◽  
Optical Measurement ◽  
Single Point ◽  
Bessel Beam ◽  
Three Dimensional ◽  
Diffraction Limit ◽  
Point Of View ◽  
Three Dimensions ◽  
Three Dimension ◽  
Single View

Here we present an optical measurement technique and image analysis process capable of tracking particles in three dimensions with a single point of view. In addition to single view 3D-PTV, the optical system is capable of tracking individual particles even at particle-particle spacings that are closer then the diffraction limit of the base imaging system. The measurement system, termed Bessel Beam Microscopy (BBM), functions as an attachment for a microscope that fits between the microscope base and camera. The addition of the BBM attachment transforms the point spread function (PSF) of the microscope allowing two unique functions: single image superresolution imaging, and the extraction of three dimension location information of particles without calibration. The result is a fluid characterization tool with unique capabilities for velocimetry and characterization of the dynamics of dense fluid-particle suspensions.

scholarly journals Shape Measurement Method of Two-Dimensional Micro-Structures beyond the Diffraction Limit Based on Speckle Interferometry

Photonics ◽  
2021 ◽  
Vol 8 (10) ◽  
pp. 420
Author(s):  
Yasuhiko Arai
Keyword(s):  
Phase Distribution ◽  
Scattered Light ◽  
Three Dimensional ◽  
Speckle Interferometry ◽  
Diffraction Limit ◽  
Objective Lens ◽  
Two Dimensional ◽  
Phase Detection ◽  
Fibrous Materials ◽  
Noise Component

A technique based on speckle interferometry for observing microstructures beyond the diffraction limit by detecting the spatial phase distribution of scattered light from microstructures has previously been reported. In this study, the development of this technique using a two-dimensional method is discussed. In order to observe general two-dimensional images, development of new technology in several stages is required. A two-dimensional filtering technique to reduce the noise component and a two-dimensional integration path to detect the three-dimensional shape of the surface are described in detail. As a first step toward observing complex two-dimensional structures in the future, it is investigated that directional two-dimensional information such as fibrous materials and micro-linear structures can be visually captured and treated as meaningful two-dimensional structures. As a result, it is shown that it is possible to observe fine two-dimensional letters with a line width of 100 nm, which is beyond the diffraction limit of the objective lens, demonstrating the effectiveness of the observation technique for microstructures by phase detection.

Nonscanning Three-Dimensional Optical Microscope Based on the Reflectivity-Height Transformation for Biological Measurements

2013 ◽  
Vol 19 (2) ◽  
pp. 425-432 ◽  
Author(s):  
Ming-Hung Chiu ◽  
Chen-Tai Tan ◽  
Tsuan-Shih Lee ◽  
Jain-Cheng Lee
Keyword(s):  
Incident Angle ◽  
Three Dimensional ◽  
Surface Profile ◽  
Optical Microscope ◽  
Diffraction Limit ◽  
Charge Coupled Device ◽  
Two Dimensional Image ◽  
Transparent Plate ◽  
3D Profile ◽  
Better Than

AbstractWe propose a nonscanning three-dimensional (3D) optical microscope based on reflectivity-height transformation in applications of biological and transparent plate measurements. The reflectivity of a prism can be transformed to the surface height of the specimen based on geometrical optics and the principle of internal reflection. Thus, the pattern of reflectivity is representative of the surface profile. Using charge-coupled device cameras to obtain the two-dimensional image patterns and combining with its reflectivity pattern, the 3D profile can be generated. The lateral resolution is determined by the diffraction limit, and the vertical resolution is better than several nanometers according to the incident angle and polarization used.

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