Ultralow-Power High-Performance Si Photonic Transmitter

2010 ◽  
Author(s):  
Guoliang Li ◽  
Xuezhe Zheng ◽  
Jon Lexau ◽  
Ying Luo ◽  
Hiren Thacker ◽  
...  
Keyword(s):  
High Performance ◽  
Ultralow Power

Ultralow-power silicon photonic interconnect for high-performance computing systems

2010 ◽  
Author(s):  
GuoLiang Li ◽  
Xuezhe Zheng ◽  
Jon Lexau ◽  
Ying Luo ◽  
Hiren Thacker ◽  
...  
Keyword(s):  
High Performance Computing ◽  
High Performance ◽  
Computing Systems ◽  
Silicon Photonic ◽  
Ultralow Power ◽  
Performance Computing

High Performance Gallium Nitride GAA Nanowire with 7nm Diameter for Ultralow-Power Logic Applications

2014 ◽  
Vol 60 (1) ◽  
pp. 1045-1050 ◽  
Author(s):  
A. K. T V ◽  
M.-C. Chen ◽  
G. Sheu ◽  
S.-M. Yang
Keyword(s):  
Gallium Nitride ◽  
High Performance ◽  
Ultralow Power

High-Performance Junctionless MOSFETs for Ultralow-Power Analog/RF Applications

2012 ◽  
Vol 33 (10) ◽  
pp. 1477-1479 ◽  
Author(s):  
Dipankar Ghosh ◽  
Mukta Singh Parihar ◽  
G. Alastair Armstrong ◽  
Abhinav Kranti
Keyword(s):  
High Performance ◽  
Rf Applications ◽  
Ultralow Power

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

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