scholarly journals Super-resolution Polarized Raman Microscopy on Sub-surface Nanostructures

2021 ◽  
Author(s):  
Zheng Li ◽  
Nili Persits ◽  
Dodd Gray ◽  
Rajeev Jagga Ram
Keyword(s):  
Super Resolution ◽  
Raman Microscopy ◽  
Surface Nanostructures ◽  
Polarized Raman

scholarly journals Macroscopic Ensembles of Aligned Carbon Nanotubes in Bubble Imprints Studied by Polarized Raman Microscopy

2014 ◽  
Vol 2014 ◽  
pp. 1-7
Author(s):  
Shota Ushiba ◽  
Jordan Hoyt ◽  
Kyoko Masui ◽  
Junichiro Kono ◽  
Satoshi Kawata ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Coffee Ring ◽  
Aligned Carbon Nanotubes ◽  
Wide Range ◽  
Optical Applications ◽  
Polarized Raman ◽  
Short Time ◽  
Opening Up

We study the alignment of single-wall carbon nanotubes (SWCNTs) in bubble imprints through polarized Raman microscopy. A hemispherical bubble containing SWCNTs is pressed against a glass substrate, resulting in an imprint of the bubble membrane with a coffee ring on the substrate. We find that macroscopic ensembles of aligned SWCNTs are obtained in the imprints, in which there are three patterns of orientations: (i) azimuthal alignment on the coffee ring, (ii) radial alignment at the edge of the membrane, and (iii) random orientation at the center of the membrane. We also find that the alignment of SWCNTs in the imprints can be manipulated by spinning bubbles. The orientation of SWCNTs on the coffee ring is directed radially, which is orthogonal to the case of unspun bubbles. This approach enables one to align SWCNTs in large quantities and in a short time, potentially opening up a wide range of CNT-based electronic and optical applications.

Pushing the limit of confocal polarized Raman microscopy

2007 ◽  
Vol 85 (10) ◽  
pp. 806-815 ◽  
Author(s):  
François Lagugné-Labarthet
Keyword(s):  
Review Paper ◽  
Polarized Light ◽  
Raman Microscopy ◽  
Polymer Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Imaging Results ◽  
Polarized Raman ◽  
Orientation Parameters

Raman microscopy has emerged as a powerful technique to characterize anisotropic materials with sub micro meter resolution. The use of polarized light allows one to obtain precise information about the local organization of the relevant molecular groups through the determination of the most probable distribution function. Such polarization analysis can be conducted under a confocal microscope, but caution must be exercised because of the use of objectives of high numerical value. The molecular orientation can be effectively correlated with the topography of the sample when atomic force microscopy experiments are conducted on the same object. In the present review paper, we present Raman imaging results that have been conducted on mesostructured polymer surfaces and on a single isolated semiconductor nanowire.Key words: Raman spectroscopy, confocal microscopy, orientation parameters, azopolymers, nanowires.

scholarly journals Improving spatial resolution of confocal Raman microscopy by super-resolution image restoration

2016 ◽  
Vol 24 (10) ◽  
pp. 10767 ◽  
Author(s):  
Han Cui ◽  
Weiqian Zhao ◽  
Yun Wang ◽  
Ying Fan ◽  
Lirong Qiu ◽  
...  
Keyword(s):  
Image Restoration ◽  
Spatial Resolution ◽  
Super Resolution ◽  
Raman Microscopy ◽  
Confocal Raman Microscopy ◽  
Resolution Image ◽  
Confocal Raman

scholarly journals Fast and quantitative 2D and 3D orientation mapping using Raman microscopy

2019 ◽  
Vol 10 (1) ◽  
Author(s):  
Oleksii Ilchenko ◽  
Yuriy Pilgun ◽  
Andrii Kutsyk ◽  
Florian Bachmann ◽  
Roman Slipets ◽  
...  
Keyword(s):  
Materials Science ◽  
Three Dimensional ◽  
Raman Microscopy ◽  
Inorganic Materials ◽  
Grain Structure ◽  
Chemical Mapping ◽  
Orientation Mapping ◽  
Polarized Raman ◽  
Raman Scattering Spectra ◽  
Non Destructive

AbstractNon-destructive orientation mapping is an important characterization tool in materials science and geoscience for understanding and/or improving material properties based on their grain structure. Confocal Raman microscopy is a powerful non-destructive technique for chemical mapping of organic and inorganic materials. Here we demonstrate orientation mapping by means of Polarized Raman Microscopy (PRM). While the concept that PRM is sensitive to orientation changes is known, to our knowledge, an actual quantitative orientation mapping has never been presented before. Using a concept of ambiguity-free orientation determination analysis, we present fast and quantitative single-acquisition Raman-based orientation mapping by simultaneous registration of multiple Raman scattering spectra obtained at different polarizations. We demonstrate applications of this approach for two- and three-dimensional orientation mapping of a multigrain semiconductor, a pharmaceutical tablet formulation and a polycrystalline sapphire sample. This technique can potentially move traditional X-ray and electron diffraction type experiments into conventional optical laboratories.

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