Correlation between electrical direct current resistivity and plasmonic properties of CMOS compatible titanium nitride thin films
2016 ◽
Vol 688
◽
pp. 44-50
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Keyword(s):
1994 ◽
Vol 12
(2)
◽
pp. 476-483
◽
1989 ◽
Vol 50
(C7)
◽
pp. C7-169-C7-173
Keyword(s):
Keyword(s):
1986 ◽
Vol 4
(6)
◽
pp. 2463-2469
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