Characterization of Bragg Gratings in Al2O3 Waveguides Fabricated by Focused Ion Beam Milling and Laser Interference Lithography

2010 ◽  
Author(s):  
F. Ay ◽  
E. H. Bernhardi ◽  
L. Agazzi ◽  
J. D. B. Bradley ◽  
K. Wörhoff ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Bragg Gratings ◽  
Interference Lithography ◽  
Laser Interference Lithography ◽  
Laser Interference ◽  
Focused Ion Beam Milling

scholarly journals Fabrication and characterization of high-TcYBa2Cu3O7−xnanoSQUIDs made by focused ion beam milling

2008 ◽  
Vol 19 (31) ◽  
pp. 315304 ◽  
Author(s):  
C H Wu ◽  
Y T Chou ◽  
W C Kuo ◽  
J H Chen ◽  
L M Wang ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Fabrication And Characterization ◽  
Focused Ion Beam Milling

Characterization of TiN thin films subjected to nanoindentation using focused ion beam milling

2004 ◽  
Vol 237 (1-4) ◽  
pp. 627-631 ◽  
Author(s):  
L.W. Ma ◽  
J.M. Cairney ◽  
M.J. Hoffman ◽  
P.R. Munroe
Keyword(s):  
Thin Films ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Tin Thin Films ◽  
Focused Ion Beam Milling
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