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Near infrared spectroscopic characterization of metamaterials fabricated by focused ion beam milling
2012 17th Opto-Electronics and Communications Conference
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10.1109/oecc.2012.6276788
◽
2012
◽
Author(s):
J. Kim
◽
Y. U. Lee
◽
Boyoung Kang
◽
J. H. Woo
◽
E. Choi
◽
...
Keyword(s):
Focused Ion Beam
◽
Near Infrared
◽
Ion Beam
◽
Spectroscopic Characterization
◽
Infrared Spectroscopic
◽
Focused Ion Beam Milling
Download Full-text
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10.1016/j.amjcard.2016.10.031
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Near-infrared spectroscopic characterization of human advanced atherosclerotic plaques
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Focused Ion Beam Milling
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Characterization of TiN thin films subjected to nanoindentation using focused ion beam milling
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◽
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◽
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◽
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◽
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◽
Focused Ion Beam
◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
Transmission Electron
◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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Focused Ion Beam
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Focused Ion Beam Milling
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◽
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◽
Ion Beam
◽
Bragg Gratings
◽
Interference Lithography
◽
Laser Interference Lithography
◽
Laser Interference
◽
Focused Ion Beam Milling
Download Full-text
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