scholarly journals A Simple Microstrip Bandstop Filter Using Cross-Coupling Stubs

2012 ◽  
Vol 2012 ◽  
pp. 1-6 ◽  
Author(s):  
Leung Chiu ◽  
Quan Xue

This paper presents an alterative implementation of a shunt open-circuited stub for multilayer microwave circuit. With making use of the proposed implementation, a simple and compact bandstop filter with a district bandstop characteristics and a first spurious at the third harmonic is proposed. The proposed filter exhibits about 12.5% fractional bandwidth of −10 dB signal rejection at the center frequency of 2.04 GHz and flat group delay at the pass bands. Besides, by cascading a number of the proposed bandstop filters designed at the different frequencies, multiband bandstop filters can be easily realized. A dual- (tri-) band design at the center frequencies of 2 GHz and 3 GHz (and 4 GHz) is designed, realized, and measured. The proposed bandstop filter well suits the nowadays multilayer and compact radio frequency integrated circuit design.

Author(s):  
Hung-Sung Lin ◽  
Ying-Chin Hou ◽  
Juimei Fu ◽  
Mong-Sheng Wu ◽  
Vincent Huang ◽  
...  

Abstract The difficulties in identifying the precise defect location and real leakage path is increasing as the integrated circuit design and process have become more and more complicated in nano scale technology node. Most of the defects causing chip leakage are detectable with only one of the FA (Failure Analysis) tools such as LCD (Liquid Crystal Detection) or PEM (Photon Emission Microscope). However, due to marginality of process-design interaction some defects are often not detectable with only one FA tool [1][2]. This paper present an example of an abnormal power consumption process-design interaction related defect which could only be detected with more advanced FA tools.


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