2012 IEEE International Conference on IC Design & Technology
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Published By IEEE

9781467301459, 9781467301466, 9781467301442

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ICICDT: IEEE International Conference on Integrated Circuit Design and Technology

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232883 ◽

2012 ◽

Keyword(s):

Circuit Design ◽

Integrated Circuit ◽

Design And Technology ◽

Integrated Circuit Design ◽

International Conference ◽

Ieee International Conference

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A mixed LPDDR2 impedance calibration technique exploiting 28nm Fully-Depleted SOI Back-Biasing

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232877 ◽

2012 ◽

Author(s):

Dimitri Soussan ◽

Alexandre Valentian ◽

Sylvain Majcherczak ◽

Marc Belleville

Keyword(s):

Calibration Technique ◽

Fully Depleted

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Optimization problems for plasma-induced damage - A concept for plasma-induced damage design

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232840 ◽

2012 ◽

Cited By ~ 1

Author(s):

Koji Eriguchi ◽

Yoshinori Nakakubo ◽

Asahiko Matsuda ◽

Masayuki Kamei ◽

Yoshinori Takao ◽

...

Keyword(s):

Optimization Problems

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Low-power ultra-Wide-Band Impulse Radio transceivers for short range communications

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232865 ◽

2012 ◽

Author(s):

Andrea Neviani ◽

Andrea Bevilacqua ◽

Andrea Gerosa ◽

Daniele Vogrig

Keyword(s):

Low Power ◽

Short Range ◽

Wide Band ◽

Impulse Radio ◽

Ultra Wide Band ◽

Radio Transceivers

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A new statistical setup and hold time definition

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232837 ◽

2012 ◽

Cited By ~ 3

Author(s):

Xiaoliang Bai ◽

Prayag Patel ◽

Xiaonan Zhang

Keyword(s):

Hold Time

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Energy efficiency deterioration by variability in SRAM and circuit techniques for energy saving without voltage reduction

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232859 ◽

2012 ◽

Cited By ~ 2

Author(s):

A. Kawasumi ◽

Y. Takeyama ◽

O. Hirabayashi ◽

K. Kushida ◽

F. Tachibana ◽

...

Keyword(s):

Energy Efficiency ◽

Energy Saving ◽

Circuit Techniques

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Reliability driven guideline for BEOL Optimization: Protecting MOS stacks from hydrogen-related impurity penetration

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232838 ◽

2012 ◽

Author(s):

Ziyuan Liu ◽

Fumihiko Hayashi ◽

Shinji Fujieda ◽

Markus Wilde ◽

Katsuyuki Fukutani

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Low-energy signal processing using circuit-level timing-error acceptance

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232873 ◽

2012 ◽

Cited By ~ 3

Author(s):

Ku He ◽

Andreas Gerstlauer ◽

Michael Orshansky

Keyword(s):

Signal Processing ◽

Low Energy ◽

Timing Error ◽

Energy Signal

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ICICDT: 2012 IEEE International Conference on IC Design & Technology [CD Label]

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232849 ◽

2012 ◽

Cited By ~ 1

Keyword(s):

Ic Design ◽

International Conference ◽

Ieee International Conference

Download Full-text

ICICDT: IEEE International Conference on Integrated Circuit Design and Technology [front matter]

2012 IEEE International Conference on IC Design & Technology ◽

10.1109/icicdt.2012.6232885 ◽

2012 ◽

Keyword(s):

Circuit Design ◽

Integrated Circuit ◽

Design And Technology ◽

Integrated Circuit Design ◽

International Conference ◽

Ieee International Conference

Download Full-text

2012 IEEE International Conference on IC Design & TechnologyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

ICICDT: IEEE International Conference on Integrated Circuit Design and Technology

A mixed LPDDR2 impedance calibration technique exploiting 28nm Fully-Depleted SOI Back-Biasing

Optimization problems for plasma-induced damage - A concept for plasma-induced damage design

Low-power ultra-Wide-Band Impulse Radio transceivers for short range communications

A new statistical setup and hold time definition

Energy efficiency deterioration by variability in SRAM and circuit techniques for energy saving without voltage reduction

Reliability driven guideline for BEOL Optimization: Protecting MOS stacks from hydrogen-related impurity penetration

Low-energy signal processing using circuit-level timing-error acceptance

ICICDT: 2012 IEEE International Conference on IC Design & Technology [CD Label]

ICICDT: IEEE International Conference on Integrated Circuit Design and Technology [front matter]

2012 IEEE International Conference on IC Design & Technology
Latest Publications