Comparison of Stress Properties in SiOx, SiNx, and SiOxNy Thin Films
Grown by Inductively Coupled Plasma CVD
2020 ◽
Keyword(s):
2015 ◽
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2004 ◽
Vol 71
(1)
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pp. 54-62
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2010 ◽
Vol 205
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pp. S227-S230
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2013 ◽
Vol 52
(11S)
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pp. 11NB05
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