Investigation of Electron Cyclotron Resonance Chemical Vapor Deposition Process for a-Si:H Deposition, Film Characterization and In Situ Plasma Diagnostics

2015 ◽  
Vol 4 (7) ◽  
pp. P213-P219 ◽  
Author(s):  
L. C. Hu ◽  
C. J. Wang ◽  
Y. W. Lin ◽  
T. C. Wei ◽  
C. C. Lee ◽  
...  
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