Investigation of Electron Cyclotron Resonance Chemical Vapor Deposition Process for a-Si:H Deposition, Film Characterization and In Situ Plasma Diagnostics
2015 ◽
Vol 4
(7)
◽
pp. P213-P219
◽
1996 ◽
Vol 14
(3)
◽
pp. 1687
◽
1996 ◽
Vol 14
(3)
◽
pp. 1072-1075
◽
1993 ◽
Vol 140
(12)
◽
pp. 3588-3590
◽
2002 ◽
Vol 235
(1-4)
◽
pp. 333-339
◽
1995 ◽
Vol 05
(C5)
◽
pp. C5-671-C5-677