scholarly journals The Role Played in the Improvement of the SiO2/SiC Interface by a Thin SiO2 Film Thermally Grown Prior to Oxide Film Deposition

2012 ◽  
Vol 2 (1) ◽  
pp. P8-P10 ◽  
Author(s):  
E. Pitthan ◽  
R. Palmieri ◽  
S. A. Correa ◽  
G. V. Soares ◽  
H. I. Boudinov ◽  
...  
1995 ◽  
Vol 86 (1-4) ◽  
pp. 128-133 ◽  
Author(s):  
P. Baeri ◽  
R. Reitano ◽  
N. Marino

1999 ◽  
Author(s):  
K. Murai ◽  
S. Tamura ◽  
M. Kiuchi ◽  
N. Umesaki ◽  
E. Minami ◽  
...  

1996 ◽  
Vol 438 ◽  
Author(s):  
Xi-Mao Bao ◽  
Ting Gao ◽  
Feng Yan ◽  
Song Tong

AbstractThe SiO2 films thermally grown on crystalline Si were implanted with Ge ions at 60 keV with doses of l×1015 cm-2 and l×1016 cm-2, followed by thermal annealing at various temperatures. Under an ultraviolet excitation of 240 nm, the films exhibit intense violet luminescence with a peak at 396 nm. This peak is ascribed to the T1 → S0 transition in GeO formed during implantation and annealing. After 1100°C annealing, Ge clusters were formed in an SiO2 matrix and a PL peak at 840 nm, due to the quantum confinement effect, which was measured at low temperature (77 K).


2013 ◽  
Vol 10 (12) ◽  
pp. 1061-1073 ◽  
Author(s):  
Katja Rügner ◽  
Rüdiger Reuter ◽  
Dirk Ellerweg ◽  
Teresa de los Arcos ◽  
Achim von Keudell ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document