Low Frequency Noise Analysis of Top-Gate MgZnO Thin-Film Transistor with High-κ ZrO2 Gate Insulator

2011 ◽  
Vol 14 (9) ◽  
pp. H385 ◽  
Author(s):  
Hsien-Chin Chiu ◽  
Hsiang-Chun Wang ◽  
Che-Kai Lin ◽  
Chau-Wei Chiu ◽  
Jeffrey S. Fu ◽  
...  
Keyword(s):  
Thin Film ◽  
Noise Analysis ◽  
Thin Film Transistor ◽  
Low Frequency ◽  
Gate Insulator ◽  
Frequency Noise ◽  
Low Frequency Noise

Grain boundary trap passivation in polysilicon thin film transistor investigated by low frequency noise

2001 ◽  
Vol 383 (1-2) ◽  
pp. 303-306 ◽  
Author(s):  
A. Mercha ◽  
L. Pichon ◽  
R. Carin ◽  
K. Mourgues ◽  
O. Bonnaud
Keyword(s):  
Thin Film ◽  
Grain Boundary ◽  
Thin Film Transistor ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Density of States Extraction in Bulk Channel Area of a-Si:H Thin-Film Transistors by Using Low-Frequency Noise Analysis

2011 ◽  
Vol 378-379 ◽  
pp. 642-645
Author(s):  
Kyunghwan Lee ◽  
Younghwan Son ◽  
Jaeho Lee ◽  
Jae Hong Lee ◽  
Seunghyun Jang ◽  
...  
Keyword(s):  
Thin Film ◽  
Exponential Distribution ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Noise Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Noise Power ◽  
Low Frequency Noise ◽  
Band Tail

Density of states in the channel bulk area of a-Si:H thin-film transistors (TFTs) was extracted by using low-frequency noise analysis. The drain current noise power spectral density shows 1/ƒγ behavior at relatively high frequencies (ƒ > 1 kHz), which is due to the exponential distribution of tail states. For the analysis, the modified number fluctuation model which is correlated with mobility fluctuation was used. From the relationship (γ=1- kT/Et ) between exponent γ and the slope of exponential distribution Et of band tail states, the distribution of the band tail near conduction band was extracted.

Low frequency noise analysis on organic thin film transistors

2008 ◽  
Vol 104 (12) ◽  
pp. 124502 ◽  
Author(s):  
Lin Ke ◽  
Surani Bin Dolmanan ◽  
Lu Shen ◽  
Chellappan Vijila ◽  
Soo Jin Chua ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Noise Analysis ◽  
Low Frequency ◽  
Organic Thin Film Transistors ◽  
Frequency Noise ◽  
Organic Thin Film ◽  
Low Frequency Noise

scholarly journals Low-frequency noise in hydrogenated amorphous silicon thin film transistor

2017 ◽  
Vol 66 (23) ◽  
pp. 237101
Author(s):  
Liu Yuan ◽  
He Hong-Yu ◽  
Chen Rong-Sheng ◽  
Li Bin ◽  
En Yun-Fei ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Thin Film Transistor ◽  
Hydrogenated Amorphous Silicon ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Silicon Thin Film ◽  
Hydrogenated Amorphous

Low-Frequency Noise Performance of a Bilayer InZnO–InGaZnO Thin-Film Transistor for Analog Device Applications

2010 ◽  
Vol 31 (10) ◽  
pp. 1128-1130 ◽  
Author(s):  
Sanghun Jeon ◽  
Sun Il Kim ◽  
Sungho Park ◽  
Ihun Song ◽  
Jaechul Park ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Low Frequency ◽  
Frequency Noise ◽  
Noise Performance ◽  
Low Frequency Noise ◽  
Analog Device ◽  
Device Applications

Investigation of the Gate Bias Stress Instability in ZnO Thin Film Transistors by Low-Frequency Noise Analysis

2013 ◽  
Vol 52 (4S) ◽  
pp. 04CF04 ◽  
Author(s):  
Kwang-Seok Jeong ◽  
Ho-Jin Yun ◽  
Yu-Mi Kim ◽  
Seung-Dong Yang ◽  
Sang-Youl Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Noise Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Zno Thin Film ◽  
Gate Bias ◽  
Low Frequency Noise ◽  
Bias Stress ◽  
Gate Bias Stress
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