scholarly journals Analysis of low frequency noise characteristics of praseodymium doped indium gallium oxide thin film transistor

2021 ◽  
Vol 0 (0) ◽  
pp. 0-0
Author(s):  
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◽  
◽  
Keyword(s):  
Thin Film ◽  
Gallium Oxide ◽  
Thin Film Transistor ◽  
Low Frequency ◽  
Oxide Thin Film ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characteristics ◽  
Indium Gallium

Low-Frequency Noise in Amorphous Indium–Gallium–Zinc-Oxide Thin-Film Transistors

2009 ◽  
Vol 30 (5) ◽  
pp. 505-507 ◽  
Author(s):  
Jeong-Min Lee ◽  
Woo-Seok Cheong ◽  
Chi-Sun Hwang ◽  
In-Tak Cho ◽  
Hyuck-In Kwon ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Oxide Thin Film ◽  
Frequency Noise ◽  
Indium Gallium Zinc Oxide ◽  
Low Frequency Noise ◽  
Zinc Oxide Thin Film ◽  
Indium Gallium

Low-frequency noise in amorphous indium-gallium-zinc oxide thin-film transistors from subthreshold to saturation

2010 ◽  
Vol 97 (12) ◽  
pp. 122104 ◽  
Author(s):  
Jae Chul Park ◽  
Sang Wook Kim ◽  
Chang Jung Kim ◽  
Sungchul Kim ◽  
Dae Hwan Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Oxide Thin Film ◽  
Frequency Noise ◽  
Indium Gallium Zinc Oxide ◽  
Low Frequency Noise ◽  
Zinc Oxide Thin Film ◽  
Indium Gallium

scholarly journals ALD Al2O3 gate dielectric on the reduction of interface trap density and the enhanced photo-electric performance of IGO TFT

RSC Advances ◽  
2020 ◽  
Vol 10 (17) ◽  
pp. 9902-9906 ◽  
Author(s):  
Kuan-Yu Chen ◽  
Chih-Chiang Yang ◽  
Chun-Yuan Huang ◽  
Yan-Kuin Su
Keyword(s):  
Thin Film ◽  
Gallium Oxide ◽  
Gate Dielectric ◽  
Thin Film Transistor ◽  
Trap Density ◽  
Oxide Thin Film ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Indium Gallium ◽  
Al2o3 Gate Dielectric

The amorphous indium gallium oxide thin film transistor was fabricated using a cosputtering method.

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