Infinite Etch Selectivity during Etching of SiON with an Extreme Ultraviolet Resist Pattern in Dual-Frequency Capacitively Coupled Plasmas

2010 ◽  
Vol 157 (1) ◽  
pp. D21 ◽  
Author(s):  
B. S. Kwon ◽  
J. S. Kim ◽  
N.-E. Lee ◽  
S. K. Lee
2014 ◽  
Vol 115 (23) ◽  
pp. 233303 ◽  
Author(s):  
De-Qi Wen ◽  
Quan-Zhi Zhang ◽  
Wei Jiang ◽  
Yuan-Hong Song ◽  
Annemie Bogaerts ◽  
...  

2004 ◽  
Vol 43 (8A) ◽  
pp. 5533-5539 ◽  
Author(s):  
Kazuki Denpoh ◽  
Go Wakayama ◽  
Kenichi Nanbu

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