ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Work Function Control on High K Metal Gate Stacks
ECS Transactions
◽
10.1149/1.3206605
◽
2019
◽
Vol 25
(6)
◽
pp. 33-48
◽
Cited By ~ 4
Author(s):
John Robertson
Keyword(s):
Work Function
◽
Gate Stacks
◽
Metal Gate
◽
High K
Download Full-text
Related Documents
Cited By
References
Bottom-up method for work function tuning in high-k/metal gate stacks in advanced CMOS technologies
2011 11th IEEE International Conference on Nanotechnology
◽
10.1109/nano.2011.6144557
◽
2011
◽
Cited By ~ 2
Author(s):
Mrunal A. Khaderbad
◽
Rohit Pandharipande
◽
Aradhana Gautam
◽
Abhishek Mishra
◽
Meenakshi Bhaisare
◽
...
Keyword(s):
Work Function
◽
Gate Stacks
◽
Metal Gate
◽
Bottom Up
◽
High K
◽
Work Function Tuning
Download Full-text
The effects of process condition of top-TiN and TaN thickness on the effective work function of MOSCAP with high-k/metal gate stacks
Journal of Semiconductors
◽
10.1088/1674-4926/35/10/106002
◽
2014
◽
Vol 35
(10)
◽
pp. 106002
◽
Cited By ~ 3
Author(s):
Xueli Ma
◽
Hong Yang
◽
Wenwu Wang
◽
Huaxiang Yin
◽
Huilong Zhu
◽
...
Keyword(s):
Work Function
◽
Process Condition
◽
Gate Stacks
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
High K
Download Full-text
Investigation of Bias-Temperature Instability in work-function-tuned high-k/metal-gate stacks
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
◽
10.1116/1.3054352
◽
2009
◽
Vol 27
(1)
◽
pp. 459
◽
Cited By ~ 7
Author(s):
B. Kaczer
◽
A. Veloso
◽
Ph. J. Roussel
◽
T. Grasser
◽
G. Groeseneken
Keyword(s):
Work Function
◽
Gate Stacks
◽
Metal Gate
◽
Temperature Instability
◽
Bias Temperature Instability
◽
High K
Download Full-text
Fluorine implantation for effective work function control in p-type metal-oxide-semiconductor high-k metal gate stacks
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
◽
10.1116/1.3521471
◽
2011
◽
Vol 29
(1)
◽
pp. 01A905
◽
Cited By ~ 1
Author(s):
A. Fet
◽
V. Häublein
◽
A. J. Bauer
◽
H. Ryssel
◽
L. Frey
Keyword(s):
Metal Oxide
◽
Work Function
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Gate Stacks
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
High K
◽
P Type
Download Full-text
Analysis on Variations of Metal Gate Work Function on Junctionless Double Gate MOSFET with High-k Spacers
2020 International Conference on Emerging Trends in Communication, Control and Computing (ICONC3)
◽
10.1109/iconc345789.2020.9117425
◽
2020
◽
Author(s):
Gaurav Dhiman
◽
Rajeev Pourush
Keyword(s):
Work Function
◽
Double Gate
◽
Metal Gate
◽
High K
◽
Double Gate Mosfet
◽
Gate Work Function
Download Full-text
Tradeoff Between Hot Carrier and Negative Bias Temperature Degradations in High-Performance $\hbox{Si}_{1 - x}\hbox{Ge}_{x}$ pMOSFETs With High-$k$/Metal Gate Stacks
IEEE Electron Device Letters
◽
10.1109/led.2010.2071851
◽
2010
◽
Author(s):
Won-Ho Choi
◽
Chang-Young Kang
◽
Jung-Woo Oh
◽
Byoung-Hun Lee
◽
Prashant Majhi
◽
...
Keyword(s):
High Performance
◽
Negative Bias
◽
Gate Stacks
◽
Metal Gate
◽
Hot Carrier
◽
High K
Download Full-text
Effect of La$_{2}$O$_{3}$ Capping Layer Thickness on Hot-Carrier Degradation of n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors with High-$k$/Metal Gate Stacks
Japanese Journal of Applied Physics
◽
10.1143/jjap.51.02bc10
◽
2012
◽
Vol 51
(2)
◽
pp. 02BC10
Author(s):
Dongwoo Kim
◽
Seonhaeng Lee
◽
Cheolgyu Kim
◽
Taekyung Oh
◽
Bongkoo Kang
Keyword(s):
Metal Oxide
◽
Layer Thickness
◽
Field Effect
◽
Field Effect Transistors
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Gate Stacks
◽
Metal Gate
◽
Hot Carrier
◽
High K
Download Full-text
Systematic study on work-function-shift in metal/Hf-based high-k gate stacks
Applied Physics Letters
◽
10.1063/1.3103314
◽
2009
◽
Vol 94
(12)
◽
pp. 122905
◽
Cited By ~ 8
Author(s):
Yuki Kita
◽
Shinichi Yoshida
◽
Takuji Hosoi
◽
Takayoshi Shimura
◽
Kenji Shiraishi
◽
...
Keyword(s):
Work Function
◽
Systematic Study
◽
Gate Stacks
◽
High K
Download Full-text
Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress
Microelectronics Reliability
◽
10.1016/j.microrel.2012.06.011
◽
2012
◽
Vol 52
(9-10)
◽
pp. 1901-1904
◽
Cited By ~ 1
Author(s):
Dongwoo Kim
◽
Seonhaeng Lee
◽
Cheolgyu Kim
◽
Chiho Lee
◽
Jeongsoo Park
◽
...
Keyword(s):
Gate Stacks
◽
Metal Gate
◽
Hot Carrier
◽
High K
◽
Enhanced Degradation
Download Full-text
Interplay between Dry Etch and Wet Clean in Patterning La2O3/HfO2 Containing High-k/metal Gate Stacks
ECS Transactions
◽
10.1149/1.3202632
◽
2019
◽
Vol 25
(5)
◽
pp. 29-36
Author(s):
Ingrid Vos
◽
David Hellin
◽
Christa Vrancken
◽
Jef Geypen
◽
Hugo Bender
◽
...
Keyword(s):
Gate Stacks
◽
Metal Gate
◽
High K
◽
Dry Etch
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close