The Formation and Characterisation of Lanthanum Oxide Based Si/High-k/NiSi Gate Stacks by Electron-Beam Evaporation: An Examination of In-Situ Amorphous Silicon Capping and NiSi formation
Keyword(s):
Hydrogen dissociation and incorporation into amorphous silicon produced by electron beam evaporation
1989 ◽
Vol 7
(2)
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pp. 136-143
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2015 ◽
Vol 57
(12)
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pp. 2512-2518
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2015 ◽
Vol 31
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pp. 14-18
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1996 ◽
Vol 20
(2)
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pp. 337-340
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Keyword(s):
1976 ◽
Vol 34
◽
pp. 434-435
Keyword(s):