Frequency‐Resolved Admittance Measurements on InAlAs / InGaAs / InAlAs Single‐Quantum Wells to Determine the Conduction Band Offset and the Capture Coefficient
1993 ◽
Vol 140
(5)
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pp. 1492-1495
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2006 ◽
Vol 138
(7)
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pp. 365-370
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2005 ◽
Vol 23
(3)
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pp. 1209
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2008 ◽
Vol 55-57
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pp. 821-824
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1999 ◽
Vol 28
(8)
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pp. 975-979
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Keyword(s):
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