scholarly journals Kinetics and Compositional Dependence on the Microwave Power and SiH4 /  N 2 Flow Ratio of Silicon Nitride Deposited by Electron Cyclotron Resonance Plasmas

1994 ◽  
Vol 141 (11) ◽  
pp. 3234-3237 ◽  
Author(s):  
M. J. Hernandez ◽  
J. Garrido ◽  
J. Martinez ◽  
J. Piqueras
Keyword(s):  
Silicon Nitride ◽  
Microwave Power ◽  
Cyclotron Resonance ◽  
Electron Cyclotron Resonance ◽  
Electron Cyclotron ◽  
Flow Ratio ◽  
Compositional Dependence

Low Temperature Silicon Oxidation With Electron Cyclotron Resonance Oxygen Plasma

1991 ◽  
Vol 235 ◽  
Author(s):  
K. T. Sung ◽  
S. W. Pang
Keyword(s):  
Low Temperature ◽  
Microwave Power ◽  
Cyclotron Resonance ◽  
Oxygen Plasma ◽  
Permanent Magnets ◽  
Electron Cyclotron Resonance ◽  
Electron Cyclotron ◽  
Rf Power ◽  
Source Distance ◽  
Ecr Source

ABSTRACTSilicon was oxidized at low temperature with an oxygen plasma generated by an electron cyclotron resonance (ECR) source. The ECR source utilized a multicusp magnetic field formed by permanent magnets. Microwave power at 2.45 GHz was applied to the source and if power at 13.56 MHz was applied to the sample stage. Si oxidation was studied as a function of source distance, pressure, microwave power, and rf power. The oxide thickness increases with microwave and rf power but decreases with source distance. The oxidation rate increases with pressure up to 12 mTorr, men decreases at higher pressure. The relative emission intensities in the plasma monitored using optical emission spectroscopy showed similar dependence on the source distance and microwave power. Oxidation temperature was estimated to be <100°C. Using ellipsometry and X-ray photoelectron spectroscopy, the oxidized films were found to be close to that of thermal oxide with refractive index at 1.45 and oxygen to silicon ratio of 2. From the current-voltage and capacitance-voltage measurements, the breakdown fields of these oxide films were 6.3 MV/cm and the fixed charge densities were 7×1010 cm−2.

Langmuir probe analysis of distributed electron cyclotron resonance silicon nitride deposition plasma

1998 ◽  
Vol 72 (12) ◽  
pp. 1448-1450 ◽  
Author(s):  
F. Delmotte ◽  
M. C. Hugon ◽  
B. Agius ◽  
A. M. Pointu ◽  
S. Teodoru
Keyword(s):  
Silicon Nitride ◽  
Langmuir Probe ◽  
Cyclotron Resonance ◽  
Electron Cyclotron Resonance ◽  
Electron Cyclotron ◽  
Probe Analysis
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