Electrical Characterization of 6H‐SiC Metal Oxide Semiconductor Structures at High Temperature

1998 ◽  
Vol 145 (1) ◽  
pp. 299-302 ◽  
Author(s):  
Nitya N. Singh ◽  
Andrew Rys
Keyword(s):  
High Temperature ◽  
Metal Oxide ◽  
Electrical Characterization ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Structures

Interface/border trap characterization of Al2O3/AlN/GaN metal-oxide-semiconductor structures with an AlN interfacial layer

2015 ◽  
Vol 106 (5) ◽  
pp. 051605 ◽  
Author(s):  
Shenghou Liu ◽  
Shu Yang ◽  
Zhikai Tang ◽  
Qimeng Jiang ◽  
Cheng Liu ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Interfacial Layer ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Structures

High-temperature modeling and characterization of 6H silicon carbide metal-oxide-semiconductor field-effect transistors

2005 ◽  
Vol 97 (4) ◽  
pp. 046106 ◽  
Author(s):  
Stephen K. Powell ◽  
Neil Goldsman ◽  
Aivars Lelis ◽  
James M. McGarrity ◽  
Flynn B. McLean
Keyword(s):  
Silicon Carbide ◽  
High Temperature ◽  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Temperature Modeling

Electrical characterization of deoxyribonucleic acid hybridization in metal-oxide-semiconductor-like structures

2012 ◽  
Vol 101 (9) ◽  
pp. 093703 ◽  
Author(s):  
S. Libertino ◽  
G. Cannella ◽  
V. Aiello ◽  
A. Busacca ◽  
S. Lombardo
Keyword(s):  
Metal Oxide ◽  
Deoxyribonucleic Acid ◽  
Electrical Characterization ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor
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