(Invited) Temperature Influence on Current Leakage and Hysteresis of Nc-CdSe Embedded Zr-Doped HfO2 High-k Dielectric Nonvolatile Memory

2015 ◽  
Vol 66 (4) ◽  
pp. 195-202 ◽  
Author(s):  
S. Zhang ◽  
Y. Kuo
Keyword(s):  
Nonvolatile Memory ◽  
Temperature Influence ◽  
Current Leakage ◽  
High K ◽  
High K Dielectric

Temperature Influence on Nanocrystals Embedded High-k Nonvolatile Memory Characteristics

2019 ◽  
Vol 19 (1) ◽  
pp. 41-47
Author(s):  
Chia-Han Yang ◽  
Yue Kuo ◽  
Chen-Han Lin ◽  
Way Kuo
Keyword(s):  
Nonvolatile Memory ◽  
Temperature Influence ◽  
High K ◽  
Memory Characteristics

Nonvolatile Memory Characteristics Induced in High-k Dielectric Thin Films through Electron Irradiation

2011 ◽  
Vol 59 (2(2)) ◽  
pp. 726-729 ◽  
Author(s):  
Chan-Rock Park ◽  
Hong-Kyoung Lee ◽  
Jin-Ha Hwang ◽  
Young-Hwan Hahn ◽  
Byeong-Cheol Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Irradiation ◽  
Nonvolatile Memory ◽  
Dielectric Thin Films ◽  
High K ◽  
High K Dielectric ◽  
Memory Characteristics

scholarly journals Ge nanocrystals in lanthanide-based Lu2O3 high-k dielectric for nonvolatile memory applications

2007 ◽  
Vol 102 (9) ◽  
pp. 094307 ◽  
Author(s):  
M. Y. Chan ◽  
P. S. Lee ◽  
V. Ho ◽  
H. L. Seng
Keyword(s):  
Nonvolatile Memory ◽  
High K ◽  
High K Dielectric ◽  
Memory Applications ◽  
Ge Nanocrystals

Temperature Effects on Charge Transfer Mechanisms of nc-ITO Embedded ZrHfO High-k Nonvolatile Memory Devices

2011 ◽  
Vol 1337 ◽  
Author(s):  
Chia-Han Yang ◽  
Yue Kuo ◽  
Chen-Han Lin ◽  
Way Kuo
Keyword(s):  
Gate Voltage ◽  
Nonvolatile Memory ◽  
Charge Retention ◽  
Mos Capacitors ◽  
Dielectric Thin Film ◽  
High K ◽  
Nonvolatile Memory Devices ◽  
High K Dielectric ◽  
Voltage Region ◽  
Large Charge

ABSTRACTThe nanocrystalline ITO embedded Zr-doped HfO2 high-k dielectric thin film has been made into MOS capacitors for nonvolatile memory studies. The devices showed large charge storage densities, large memory windows, and long charge retention times. In this paper, authors investigated the temperature effect on the charge transport and reliability of this kind of device in the range of 25°C to 125°C. The memory window increased with the increase of the temperature. The temperature influenced the trap and detrap of not only the deeply-trapped but also the loosely-trapped charges. The device lost its charge retention capability with the increase of the temperature. The Schottky emission relationship fitted the device in the positive gate voltage region. However, the Frenkel-Poole mechanism was suitable in the negative gate voltage region.

Self-assembled tungsten nanocrystals in high-k dielectric for nonvolatile memory application

2005 ◽  
Vol 23 (6) ◽  
pp. 2278 ◽  
Author(s):  
S. K. Samanta ◽  
Zerlinda Y. L. Tan ◽  
Won Jong Yoo ◽  
Ganesh Samudra ◽  
Sungjoo Lee ◽  
...  
Keyword(s):  
Nonvolatile Memory ◽  
High K ◽  
Self Assembled ◽  
High K Dielectric
Sign in / Sign up

Export Citation Format

Share Document