Élimination des hydrures métalliques des déchets gazeux d'un réacteur LP-MOVPE pour la croissance de composés (In, Ga) (As, P)

1993 ◽  
Vol 71 (7-8) ◽  
pp. 307-315 ◽  
Author(s):  
P. Cova ◽  
R. A. Masut ◽  
R. Lacoursière ◽  
A. Bensaada ◽  
C. A. Tran ◽  
...  

We have realized a new system for treating gaseous wastes from a metallorganic vapour phase epitaxy (MOVPE) reactor used for the low pressure epitaxial growth of intrinsic and doped semiconducting crystals in the InGaAsP family. The system is based on a series of 5 successive phases of destruction: dilution, combustion pyrolysis, condensation and filtering. The design minimizes the cost remarkably and optimizes the incineration of toxic gases. After the combustion of 138 m3 of H2 and the incineration of 276 L of phosphine, we observe that the reaction chamber does not show any corrosion nor any deposit of chemical products, which are daily eliminated together with the water produced during the combustion. For the maximum phosphine concentration that has been used (7340 ppm), no phosphine concentration has been detected in the output with a detecting system having a sensitivity of 0.001 ppm. For the total fluxes entering the reaction chamber (10–25 L/min), the transit time (1s) of gas molecules does not limit the efficiency of conversion of toxic gases. This is important if one wishes to adapt this system to a MOVPE production reaction using a higher flux of phosphine.[Journal translation]

1990 ◽  
Vol 21 (5) ◽  
pp. 29-39 ◽  
Author(s):  
A.N. Daw ◽  
D.K. Pal ◽  
M.K. Kowar

1986 ◽  
Vol 71 ◽  
Author(s):  
L. Vescan ◽  
H. Beneking ◽  
O. Meyer

AbstractBy low pressure vapour phase epitaxy (LPVPE) epitaxial growth down to 760ºC has been achieved in the SiC12H2/H2 system, as revealed by RBS and channeling measurements ( min ∼4.0%). High and relative homogeneous doping was obtained with boron resp. phosphorus in the range 1x1018 -5x1019 cm-3 for T: 800º - 900ºC. Sharp transitions in the boron doping profile to the substrate, of the order of 15mn, result only for temperatures much lower than 850ºC. Schottky barrier enhanced diodes with promising performances were formed with Ti evaporated on p+n layers grown selectively on n+ substrates.


2016 ◽  
Vol 47 ◽  
pp. 16-19 ◽  
Author(s):  
V.I. Nikolaev ◽  
A.I. Pechnikov ◽  
S.I. Stepanov ◽  
I.P. Nikitina ◽  
A.N. Smirnov ◽  
...  

2016 ◽  
Vol 51 (12) ◽  
pp. 762-770 ◽  
Author(s):  
J. Skibinski ◽  
P. Caban ◽  
T. Wejrzanowski ◽  
G.J. Oliver ◽  
K.J. Kurzydlowski

1994 ◽  
Vol 135 (1-2) ◽  
pp. 11-22 ◽  
Author(s):  
N. Piffault ◽  
E. Gil ◽  
J. Leymaire ◽  
C. Monier ◽  
S.A. Clark ◽  
...  

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