Optical orientation in p-doped semiconductor structures with a split valence band

JETP Letters ◽  
1997 ◽  
Vol 65 (12) ◽  
pp. 909-914 ◽  
Author(s):  
E. P. German ◽  
A. V. Subashiev
Author(s):  
В.П. Смагин ◽  
А.А. Исаева ◽  
Е.А. Шелепова

Nanoscale particles ZnS:Nd3+, CdS:Nd3+ and (Zn,Cd)S:Nd3+ were synthesized and doped in a polymerizing methyl methacrylate medium during the production of optically transparent polyacrylate composites of the composition PMMA/ZnS:Nd3+, PMMA/CdS:Nd3+ and PMMA/(Zn,Cd)S:Nd3+. The excitation of photoluminescence (FL) and FL of semiconductor structures in composites is associated with the transition of electrons from the valence band to the conduction band and to the levels of structural defects of semiconductor particles, followed by recombination at these levels. Based on changes in the excitation spectra of FL and FL composites, assumptions are made about the structure of particles, the distribution of Nd3+ ions in it and their effect on photoluminescence.


The optical properties of lead iodide have been measured and the fundamental absorption spectrum is interpreted in terms of ionization and excitation processes. These processes may be regarded as transitions from a split valence band to the conduction band and to exciton levels lying above and below the minimum of the conduction band. This inter­pretation is supported by measurements of photoconductivity and photodecomposition. Two mechanisms are suggested to explain the occurrence of photodecomposition and electron irradiation damage in this substance.


1989 ◽  
Vol 145 ◽  
Author(s):  
M. Lamont Schnoes ◽  
T.D. Harris ◽  
W.S. Hobson ◽  
R. M. Lum ◽  
J. K. Klingert

AbstractWe present a detailed photoluminescence and photoluminescence excitation study of GaAs grown directly on InP substrates by MOCVD. Reliable peak assignments are determined. With these peak assignments, we measure strain and strain uniformity, identify impurities, and assess material quality. Most samples exhibit three distinct spectral features. The two highest energy features are the strain split valence band, the third feature is a carbon impurity. The observed splitting is in good agreement with the value predicted from the thermal expansion mismatch.


2015 ◽  
Vol 91 (20) ◽  
Author(s):  
F. Pezzoli ◽  
A. Balocchi ◽  
E. Vitiello ◽  
T. Amand ◽  
X. Marie

2000 ◽  
Vol 07 (05n06) ◽  
pp. 667-671 ◽  
Author(s):  
A. KAKIZAKI ◽  
N. KAMAKURRA ◽  
M. SAWADA ◽  
K. HAYASHI ◽  
T. SAITOH

The magnetic properties of fcc Fe thin films with a thickness of 1–11 monolayers (ML) grown at room temperature on fcc Co, which was prepared more than 15 ML on Cu(001), have been studied by spin-resolved core level and valence band photoelectron spectroscopy. The observed exchange split valence band structures show that Fe films below 11 ML are in a high spin ferromagnetic phase. Based on the line shape analysis of 3s core level spectra with a cluster model calculation and considering the probing depth of photoelectron spectroscopy, we demonstrate that in the 5–11 ML region, only the topmost few layers of Fe film reveal ferromagnetism as observed in the Fe/Cu(001) system.


1987 ◽  
Vol 102 ◽  
Author(s):  
M. G. Lamont ◽  
T. D. Harris ◽  
R. Sauer ◽  
R. M. Lum ◽  
J. K. Klingert

ABSTRACTWe report a detailed study using photoluminescence and photoluminescence excitation of MOCVD GaAs grown directly on Si substrates. Temperature variation and selective excitation allow reliable assignment of spectral features. This assignment permits measurements of strain and strain uniformity, identification of impurities, and assessment of general materials quality. In 2–5μm thick layers similar spectra are observed with little variation from substrate character. Most samples show one of the two split valence band features plus defect recombination, always including carbon. Strain uniformity varies widely and correlates with substrate thickness. The range of spectra observed from a variety of samples, and guidelines for interpretation of nonresonantly excited spectra will be discussed.


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