Beyond the lateral resolution limit by phase imaging

2011 ◽  
Author(s):  
Y. Cotte ◽  
M. Fatih Toy ◽  
C. Depeursinge
Keyword(s):  
Lateral Resolution ◽  
Phase Imaging ◽  
Resolution Limit

Beyond the lateral resolution limit by phase imaging

2011 ◽  
Vol 16 (10) ◽  
pp. 106007 ◽  
Author(s):  
Yann Cotte ◽  
M. Fatih Toy ◽  
Christian Depeursinge
Keyword(s):  
Lateral Resolution ◽  
Phase Imaging ◽  
Resolution Limit

scholarly journals Coherence scanning and phase imaging optical interference microscopy at the lateral resolution limit

2018 ◽  
Vol 26 (6) ◽  
pp. 7376 ◽  
Author(s):  
Peter Lehmann ◽  
Weichang Xie ◽  
Benedikt Allendorf ◽  
Stanislav Tereschenko
Keyword(s):  
Interference Microscopy ◽  
Lateral Resolution ◽  
Phase Imaging ◽  
Resolution Limit ◽  
Optical Interference

The lateral resolution limit for imaging periodic conducting surfaces in capacitive microscopy

2000 ◽  
Vol 33 (22) ◽  
pp. 2890-2898 ◽  
Author(s):  
N C Bruce ◽  
A García-Valenzuela ◽  
D Kouznetsov
Keyword(s):  
Lateral Resolution ◽  
Resolution Limit

scholarly journals Storming the light limit: How far can you go?

2010 ◽  
Vol 32 (3) ◽  
pp. 30-32
Author(s):  
Peter Drent
Keyword(s):  
Biological Sciences ◽  
New Technologies ◽  
Cell Structure ◽  
Lateral Resolution ◽  
Resolution Limit ◽  
New Era ◽  
Superresolution Microscopy ◽  
Nanoscale Imaging ◽  
Optical Light Microscopy ◽  
20 Nm

Optical light microscopy is set to enter a new era of superresolution with the development of technolo gies that overcome the resolution limit of traditional light microscopes. Ideal for a variety of disciplines within the biological sciences, these new technologies enable the study of cell structure at the nanoscale, revealing cellular features previously impossible to see. Whereas nanoscale imaging has been possible for many years using electron microscopy methods, the new superresolution optical technologies en able twodimensional and threedimensional imaging of fixed and/or living specimens. In this article, we provide a brief overview of the development of superresolution microscopy and Nikon's offering for superresolution fluorescence imaging, NSIM, with lateral resolution twice that of conventional light microscopes and suitable for fixed and live cell imaging, and NSTORM, which achieves a remarkable lateral resolution of approximately 20 nm and axial resolution of approximately 50 nm in fixed specimens.

3D-Optical Interference Microscopy at the Lateral Resolution Limit

Fringe 2013 ◽  
2014 ◽  
pp. 677-682
Author(s):  
Peter Lehmann ◽  
Jan Niehues ◽  
Stanislav Tereschenko
Keyword(s):  
Interference Microscopy ◽  
Lateral Resolution ◽  
Resolution Limit ◽  
Optical Interference

scholarly journals Lateral resolution limit of laser Doppler vibrometer microscopes for the measurement of surface acoustic waves

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Robert Kowarsch ◽  
Christian Rembe
Keyword(s):  
Single Point ◽  
Surface Acoustic Waves ◽  
Numerical Aperture ◽  
Laser Doppler ◽  
Vibration Measurement ◽  
Lateral Resolution ◽  
Approximation Formula ◽  
Analytic Approximation ◽  
Resolution Limit ◽  
Measurement Deviation

AbstractThe lateral or transverse resolution of single-point interferometers for vibration measurement is especially critical for microelectromechanical systems (MEMS) vibrating up to the gigahertz range. In this regime, the acoustic wavelengths are typically in the range of the size of the laser focus. Thus, a successful vibration measurement requires distinct knowledge about the lateral resolution limit and its dependencies with instrumentation parameters. In this paper, we derive an analytic approximation formula, which allows for estimation of the systematic measurement deviation of the vibration amplitude and, thus, a definition of the lateral resolution limit of single-point interferometers for vibration measurement. Further, a compensation and an optimum numerical aperture are proposed the reduce the measurement deviation. For this, the model includes a laser-interferometer microscope of Mach-Zehnder type with Gaussian laser beams considering the Gouy effect and wavefront curvature. As a measurement scenario, an unidirectional surface acoustic wave (SAW) is regarded. The theoretic findings have been validated in the experiment with a representative vibration measurement on a SAW filter at $$433\,{\mathrm {MHz}}$$ 433 MHz with our heterodyne laser-Doppler interferometer with offset-locked semiconductor lasers. The provided formulas help instrument designers and users to choose suitable instrument parameters, especially the numerical aperture of the utilized microscope objective.

Surface topography measurement of microstructures near the lateral resolution limit via coherence scanning interferometry

2022 ◽  
Vol 152 ◽  
pp. 106949
Author(s):  
Yifeng Sun ◽  
Zhishan Gao ◽  
Jianqiu Ma ◽  
Juntao Zhou ◽  
Pengfei Xie ◽  
...  
Keyword(s):  
Surface Topography ◽  
Lateral Resolution ◽  
Resolution Limit
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