Lateral resolution limit of the laser-scanning confocal vibrometer microscope

2006 ◽  
Author(s):  
Christian Rembe
Keyword(s):  
Laser Scanning ◽  
Lateral Resolution ◽  
Resolution Limit

Beyond the lateral resolution limit by phase imaging

2011 ◽  
Vol 16 (10) ◽  
pp. 106007 ◽  
Author(s):  
Yann Cotte ◽  
M. Fatih Toy ◽  
Christian Depeursinge
Keyword(s):  
Lateral Resolution ◽  
Phase Imaging ◽  
Resolution Limit

The lateral resolution limit for imaging periodic conducting surfaces in capacitive microscopy

2000 ◽  
Vol 33 (22) ◽  
pp. 2890-2898 ◽  
Author(s):  
N C Bruce ◽  
A García-Valenzuela ◽  
D Kouznetsov
Keyword(s):  
Lateral Resolution ◽  
Resolution Limit

Diffractive Lenses for High Resolution Laser Based Failure Analysis

2005 ◽  
Author(s):  
Frank Zachariasse ◽  
Martijn J. Goossens
Keyword(s):  
High Resolution ◽  
Failure Analysis ◽  
Laser Scanning ◽  
New Method ◽  
Lateral Resolution ◽  
Back Side ◽  
Diffractive Lens ◽  
Standard Equipment ◽  
Diffractive Lenses ◽  
Better Than

Abstract In this paper we present a new method to increase the lateral resolution available in laser scanning failure analysis tools. By fabricating a diffractive lens on the back side of the die, the area of the circuit of interest, directly underneath the lens, may be studied with a lateral resolution up to 3.5 times better than without the lens. This method is easily implemented with standard equipment already present in most failure analysis laboratories, and overcomes some significant problems encountered with alternative resolution enhancing schemes.

Lateral Resolution Test for Confocal Laser Scanning Microscope

2014 ◽  
Vol 609-610 ◽  
pp. 1159-1164
Author(s):  
Jian Jun Cui
Keyword(s):  
Spatial Resolution ◽  
Laser Scanning ◽  
Performance Test ◽  
Confocal Laser Scanning Microscope ◽  
Confocal Laser Scanning ◽  
Lateral Resolution ◽  
Confocal Laser ◽  
Scanning Microscope ◽  
Laser Scanning Microscope ◽  
Line Spacing

To meet the performance test for the confocal laser scanning microscope (CLSM) accurately in some specific application occasions, the spatial resolution imaging principle of confocal laser scanning microscope was analyzed theoretically. And the micron line spacing as the measurement standard has tried to investigate the lateral resolution of CLSM in experiment. The value range of the lateral resolution was calculated by the fluctuation state of the output light intensity signal when there is the lateral movement between the objective with sample. At the same time, some reasons for spatial resolution are also been evaluated in theory. Experiments demonstrate that if the value of the line spacing standard is closer to the spatial resolution of CLSM, the standard can be utilized to test the spatial resolution. So we can use a a series of lines spacing standards with different lines spacing values to test the serial effective resolution. And in our experiment, we only measured line spacing standard with 8μm line width and 100μm line pitch with many times by CLSM, and the spatial resolution of the CLSM is obtained about more minimal than 0.3μm by the scanning curves.

scholarly journals Three-Dimension Resolution Enhanced Microscopy Based on Parallel Detection

2021 ◽  
Vol 11 (6) ◽  
pp. 2837
Author(s):  
Zhimin Zhang ◽  
Shaocong Liu ◽  
Minfei He ◽  
Yuran Huang ◽  
Cuifang Kuang ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Fluorescence Emission ◽  
Laser Scanning Microscopy ◽  
Scanning Microscopy ◽  
Lateral Resolution ◽  
Confocal Laser ◽  
Nuclear Pore ◽  
Nuclear Pore Complexes ◽  
Three Dimension ◽  
Axial Resolution

Pixel reassignment image scanning microscopy (PRISM) is a useful tool to improve the resolution of confocal laser scanning microscopy (CLSM) only equipped with a detector array. However, while it can improve the lateral resolution, it has little effect on the axial resolution. Here, new microscopy has been proposed which combines three-dimension fluorescence emission difference microscopy (3D FED) with PRISM to further improve three-dimension resolution. We call this method three-dimension pixel reassignment fluorescence emission difference microscopy (3D-PRFED). Detailed theoretical analysis and simulation are presented in this paper. Additionally, the performance of lateral and axial resolution improvement of this method has been demonstrated by imaging 100 nm fluorescent beads and nuclear pore complexes samples. Experiment results show that this method in our system can improve lateral resolution by a factor of 1.85 and axial resolution by a factor of 1.48 compared with CLSM.

scholarly journals Measuring the Size of Biological Nanostructures with Spatially Modulated Illumination Microscopy

2004 ◽  
Vol 15 (5) ◽  
pp. 2449-2455 ◽  
Author(s):  
Sonya Martin ◽  
Antonio Virgilio Failla ◽  
Udo Spöri ◽  
Christoph Cremer ◽  
Ana Pombo
Keyword(s):  
Electron Microscopy ◽  
Rna Polymerase Ii ◽  
Laser Scanning ◽  
Size Range ◽  
Confocal Laser ◽  
Size Measurement ◽  
Resolution Limit ◽  
Fluorescent Beads ◽  
Electron Microscopes ◽  
Hyperphosphorylated Form

Spatially modulated illumination fluorescence microscopy can in theory measure the sizes of objects with a diameter ranging between 10 and 200 nm and has allowed accurate size measurement of subresolution fluorescent beads (∼40–100 nm). Biological structures in this size range have so far been measured by electron microscopy. Here, we have labeled sites containing the active, hyperphosphorylated form of RNA polymerase II in the nucleus of HeLa cells by using the antibody H5. The spatially modulated illumination-microscope was compared with confocal laser scanning and electron microscopes and found to be suitable for measuring the size of cellular nanostructures in a biological setting. The hyperphosphorylated form of polymerase II was found in structures with a diameter of ∼70 nm, well below the 200-nm resolution limit of standard fluorescence microscopes.

scholarly journals Coherence scanning and phase imaging optical interference microscopy at the lateral resolution limit

2018 ◽  
Vol 26 (6) ◽  
pp. 7376 ◽  
Author(s):  
Peter Lehmann ◽  
Weichang Xie ◽  
Benedikt Allendorf ◽  
Stanislav Tereschenko
Keyword(s):  
Interference Microscopy ◽  
Lateral Resolution ◽  
Phase Imaging ◽  
Resolution Limit ◽  
Optical Interference
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