A new approach to RF MEMS shunt switch modeling from K-band up to W-band

Author(s):  
V. Puyal ◽  
D. Dragomirescu ◽  
R. Plana
Keyword(s):  
Rf Mems ◽  
W Band ◽  
Author(s):  
V. Puyal ◽  
D. Dragomirescu ◽  
C. Villeneuve ◽  
J. Lattes ◽  
J. Ruan ◽  
...  
Keyword(s):  
Rf Mems ◽  
W Band ◽  

Author(s):  
K. Girija Sravani ◽  
Koushik Guha ◽  
K. Srinivasa Rao

2011 ◽  
Vol 2011 ◽  
pp. 1-7 ◽  
Author(s):  
R. Malmqvist ◽  
C. Samuelsson ◽  
A. Gustafsson ◽  
P. Rantakari ◽  
S. Reyaz ◽  
...  

A K-band (18–26.5 GHz) RF-MEMS-enabled reconfigurable and multifunctional dual-path LNA hybrid circuit (optimised for lowest/highest possible noise figure/linearity, resp.) is presented, together with its subcircuit parts. The two MEMS-switched low-NF (higher gain) and high-linearity (lower gain) LNA circuits (paths) present 16.0 dB/8.2 dB, 2.8 dB/4.9 dB and 15 dBm/20 dBm of small-signal gain, noise figure, and 1 dB compression point at 24 GHz, respectively. Compared with the two (fixed) LNA subcircuits used within this design, the MEMS-switched LNA circuit functions show minimum 0.6–1.3 dB higher NF together with similar values ofP1 dBat 18–25 GHz. The gain of one LNA circuit path is reduced by 25–30 dB when the MEMS switch and active circuitry used within in the same switching branch are switched off to select the other LNA path and minimise power consumption.


2013 ◽  
Vol 49 (11) ◽  
pp. 704-706 ◽  
Author(s):  
A. Contreras ◽  
M. Ribó ◽  
L. Pradell ◽  
J. Casals‐Terré ◽  
F. Giacomozzi ◽  
...  
Keyword(s):  
Rf Mems ◽  

Author(s):  
A. Stehle ◽  
G. Georgiev ◽  
V. Ziegler ◽  
B. Schoenlinner ◽  
U. Prechtel ◽  
...  

2013 ◽  
Vol 389 ◽  
pp. 660-667 ◽  
Author(s):  
Ameen H. El-Sinawi ◽  
Omar A. Awad ◽  
Abdulaziz H. El-Sinawi

This work presents a new approach to modeling the dynamic behavior of a viscously damped RF-MEMS switch. The model takes into account the effect of squeeze film on resonance frequencies of the switch structure. It also presents a new approach to modeling the impact force as well as its effect on transient pull-in, and release dynamics of the perforated switch membrane. Simulation results of the proposed model are validated against experimental results of the same exact switch, and the comparison was impressive. Model results show that the model is able to capture the experimental behavior of the switch with less than 2% error.


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