Surface roughness analysis of multilayer x-ray optics

Effect of surface roughness of substrate on grazing incidence x-ray optics

10.1117/12.332518 ◽

1998 ◽

Author(s):

Keisuke Tamura ◽

Koujun Yamashita ◽

Hideyo Kunieda ◽

Yuzuru Tawara ◽

Kazutoshi Haga ◽

...

Keyword(s):

Surface Roughness ◽

Grazing Incidence ◽

Ray Optics ◽

X Ray ◽

Effect Of Surface

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Prediction and parametric optimization of surface roughness of electroless Ni-Co-P coating using Box-Behnken design

Journal of the Mechanical Behavior of Materials ◽

10.1515/jmbm-2019-0017 ◽

2019 ◽

Vol 28 (1) ◽

pp. 153-161 ◽

Cited By ~ 2

Author(s):

Subhasish Sarkar ◽

Arghya Mukherjee ◽

Rishav Kumar Baranwal ◽

Jhumpa De ◽

Chanchal Biswas ◽

...

Keyword(s):

Surface Roughness ◽

Parametric Optimization ◽

Bath Temperature ◽

Sodium Hypophosphite ◽

X Ray Diffraction ◽

Box Behnken Design ◽

X Ray ◽

Xrd Study ◽

Roughness Analysis ◽

Electroless Ni

AbstractThe current study focuses on the parametric optimization of electroless Ni-Co-P coating considering surface roughness as a response using Box-Behnken Design (BBD) of experiment. The two bath parameters namely the concentration of cobalt sulphate and sodium hypophosphite were varied along with the bath temperature to predict the variation in surface roughness. Analysis of variance (ANOVA) method has been applied to determine the interactions of the substantial factors which dominate the surface roughness of the coating. The process parameters for surface roughness of the coating were optimized by successfully utilizing the statistical model of Box-Behnken Design (BBD) of experiment. From the BBD model, the optimum condition for the deposition of the coating has been evaluated. In that specific condition, the surface roughness of the as-deposited coating is found to be 0.913μm. Scanning Electron Microscopy (SEM), Energy Dispersive X-ray Spectroscopy (EDX), and X-Ray Diffraction (XRD) study have been utilized to characterize the electroless Ni-Co-P coating deposited in optimized condition.

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Investigation of Oxide/Metal Multilayers for Soft X-Ray Optics Fabricated by Ion Beam Sputterinc

MRS Proceedings ◽

10.1557/proc-157-335 ◽

1989 ◽

Vol 157 ◽

Cited By ~ 1

Author(s):

I. Kataoka ◽

T. Yoneiitsu ◽

K. Sekine ◽

I. Yaiada ◽

K. Etoh ◽

...

Keyword(s):

Surface Roughness ◽

Correlation Function ◽

Energy Region ◽

Ion Beam ◽

Strongly Correlated ◽

Rheed Pattern ◽

Ray Optics ◽

Ion Energy ◽

X Ray

ABSTRACTThe dependence of the ordering factor and surface roughness of aiorphous SiO2 and Ni filis fabricated by Dual Ion Beai Sputtering(DIBS) assisted by Ar+ ion boibardient were evaluated. The ordering factor tas defined as a quantity which shows the degree of aiorphousness froi ris value of correlation function of the RHEED pattern. The surface roughness was leasured with a Talystep systei and STM, and the data was evaluated with respect to the spatial wavelength.For aiorphous SiO2 filis, the surface roughness is strongly correlated with the ordering factor as a parameter of the assisting Ar+ ion energy, and it depends on the fill structure. Siiilar relationship was not observed for Ni filis, because of the traced surface roughness of substrate in the energy region investigated.

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Refinement and application of X-ray diffraction method as the surface roughness analysis.

BUNSEKI KAGAKU ◽

10.2116/bunsekikagaku.51.707 ◽

2002 ◽

Vol 51 (9) ◽

pp. 707-714

Author(s):

Mikako NAKASHIMA ◽

Masao KOSAKA ◽

Hideki MONMA

Keyword(s):

Surface Roughness ◽

Diffraction Method ◽

X Ray Diffraction ◽

X Ray ◽

Roughness Analysis

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Surface roughness effects on cylindrical grazing incidence x‐ray optics for transition radiation

Journal of Applied Physics ◽

10.1063/1.354233 ◽

1993 ◽

Vol 74 (9) ◽

pp. 5320-5326 ◽

Cited By ~ 2

Author(s):

A. H. Ho ◽

M. A. Piestrup ◽

R. M. Silzer ◽

D. M. Skopik

Keyword(s):

Surface Roughness ◽

Transition Radiation ◽

Grazing Incidence ◽

Roughness Effects ◽

Ray Optics ◽

X Ray

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X-ray microprobe for materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100168013 ◽

1994 ◽

Vol 52 ◽

pp. 56-57

Author(s):

G.E. Ice

Keyword(s):

Crystallographic Orientation ◽

Local Structure ◽

Materials Science ◽

Chemical Information ◽

X Ray Diffraction ◽

Ray Optics ◽

X Ray ◽

Novel Materials ◽

New Information ◽

Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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