High-speed high-resolution OCT imaging of the retina with frequency swept lasers at 850 nm

2007 ◽  
Author(s):  
V. J. Srinivasan ◽  
R. Huber ◽  
I. Gorczynska ◽  
D. Adler ◽  
J. Y. Jiang ◽  
...  
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Oct Imaging ◽  
High Resolution Oct

scholarly journals Light-Induced Thickening of Photoreceptor Outer Segment Layer Detected by Ultra-High Resolution OCT Imaging

2016 ◽  
Vol 57 (9) ◽  
pp. OCT105 ◽  
Author(s):  
Yichao Li ◽  
Robert N. Fariss ◽  
Jennifer W. Qian ◽  
Ethan D. Cohen ◽  
Haohua Qian
Keyword(s):  
High Resolution ◽  
Outer Segment ◽  
Photoreceptor Outer Segment ◽  
Oct Imaging ◽  
High Resolution Oct

scholarly journals Three-dimensional high resolution OCT imaging of macular pathology

2009 ◽  
Vol 17 (5) ◽  
pp. 4037 ◽  
Author(s):  
C. Ahlers ◽  
U. Schmidt-Erfurth
Keyword(s):  
High Resolution ◽  
Three Dimensional ◽  
Oct Imaging ◽  
High Resolution Oct

Automatic optimization high-speed high-resolution OCT retinal imaging at 1μm

2015 ◽  
Author(s):  
Michelle Cua ◽  
Xiyun Liu ◽  
Dongkai Miao ◽  
Sujin Lee ◽  
Sieun Lee ◽  
...  
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Retinal Imaging ◽  
Automatic Optimization ◽  
High Resolution Oct

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

1999 ◽  
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Real Time ◽  
High Speed ◽  
Time Signal ◽  
Surface Imaging ◽  
Atomic Force ◽  
Submicron Structures ◽  
High Resolution Images ◽  
Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

High-speed high-resolution CMOS voltage comparator

1986 ◽  
Vol 22 (6) ◽  
pp. 338 ◽  
Author(s):  
W.T. Ng ◽  
C.A.T. Salama
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Voltage Comparator

A High Speed, High Resolution Remote MCA

1985 ◽  
Vol 32 (1) ◽  
pp. 100-104
Author(s):  
D. J. Roberts ◽  
J. J. Gregorio
Keyword(s):  
High Resolution ◽  
High Speed

scholarly journals Understanding oxide degradation mechanisms in ultra-thin SiO2 through high-speed, high-resolution in-situ measurements

2005 ◽  
Vol 80 ◽  
pp. 182-185 ◽  
Author(s):  
S. Aresu ◽  
W. De Ceuninck ◽  
R. Degraeve ◽  
B. Kaczer ◽  
G. Knuyt ◽  
...  
Keyword(s):  
High Resolution ◽  
High Speed ◽  
In Situ Measurements ◽  
Degradation Mechanisms ◽  
Oxide Degradation
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