Automatic optimization high-speed high-resolution OCT retinal imaging at 1μm

2015 ◽  
Author(s):  
Michelle Cua ◽  
Xiyun Liu ◽  
Dongkai Miao ◽  
Sujin Lee ◽  
Sieun Lee ◽  
...  
2007 ◽  
Author(s):  
V. J. Srinivasan ◽  
R. Huber ◽  
I. Gorczynska ◽  
D. Adler ◽  
J. Y. Jiang ◽  
...  

2005 ◽  
Author(s):  
Robert J. Zawadzki ◽  
Stacey Choi ◽  
Sophie Laut ◽  
John S. Werner ◽  
Steven M. Jones ◽  
...  

2007 ◽  
Vol 32 (4) ◽  
pp. 361 ◽  
Author(s):  
V. J. Srinivasan ◽  
R. Huber ◽  
I. Gorczynska ◽  
J. G. Fujimoto ◽  
J. Y. Jiang ◽  
...  

Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.


1986 ◽  
Vol 22 (6) ◽  
pp. 338 ◽  
Author(s):  
W.T. Ng ◽  
C.A.T. Salama

1985 ◽  
Vol 32 (1) ◽  
pp. 100-104
Author(s):  
D. J. Roberts ◽  
J. J. Gregorio
Keyword(s):  

2005 ◽  
Vol 80 ◽  
pp. 182-185 ◽  
Author(s):  
S. Aresu ◽  
W. De Ceuninck ◽  
R. Degraeve ◽  
B. Kaczer ◽  
G. Knuyt ◽  
...  

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